Current Headlines

  1. Hexagon Launches New Robotics Division To Drive Next-Generation Autonomy 3/31/2025

    Today, Hexagon is launching a new Robotics division, leveraging its industry-leading expertise in measurement technologies, AI and autonomous systems to advance humanoid robotics and help its customers achieve true autonomy.

  2. Anton Paar Density Meters: New Glass U-Tube Production And Improved Calibration 3/31/2025

    The heart of Anton Paar’s DMA density meters is the measuring sensor made of borosilicate glass. This material is characterized by high chemical resistance, mechanical stability and low thermal expansion.

  3. ZEISS Certified Metrology Partner 3/28/2025

    Delta XD is proud to announce its appointment as the new ZEISS Certified Metrology Partner for the United Kingdom and Ireland. Effective from March 2025, Delta XD will be responsible for the sales and aftercare of the ZEISS 3D testing hardware and software portfolio, including ARAMIS, ARGUS, PONTOS, and TRITOP.

  4. Beyond Ambiguous Reflections: Bridging Optical 3D Metrology And Computer Vision 3/27/2025

    A new method that is both accurate and widely applicable paves the way for three-dimensional imaging of reflective object surfaces.

  5. Covalent Metrology Announces Exclusive Partnership With Toray Research Center To Expand Advanced Materials Analysis Services 3/27/2025

    Covalent Metrology, a leading analytical services company based in the heart of the Silicon Valley, has announced a strategic, exclusive North American partnership with Toray Research Center, a premier research and analysis firm based in Japan.

  6. EMPIR Project Enables Launch Of Worlds First Self-Contained Portable Dew-Frost Point Calibrator 3/20/2025

    Trace water is the single largest matrix contaminant in ultra-high purity process gases such as argon, nitrogen and hydrogen. Its presence affects the quality of products where these gases are used.

  7. Samsung Electronics And Nova Jointly Awarded The Vladimir Ukraintsev Award At The SPIE Advanced Lithography Conference 3/18/2025

    Nova (Nasdaq: NVMI) today announced that its co-authored paper with Samsung Electronics on "On-Cell Thickness Monitoring of Chalcogenide Alloy Layer using Spectral Interferometry, Raman Spectroscopy, and Hybrid Machine Learning" has been selected as the winner of the Vladimir Ukraintsev Award for "Collaborations in Metrology" at SPIE's 2024 Advanced Lithography + Patterning Conference.

  8. The Creaform Metrology Suite Expands Its Capacities With The Release Of A Sheet Metal Inspection Software Module 3/13/2025

    Creaform, a business of AMETEK, Inc. and worldwide provider of automated and portable 3D measurement solutions, announced today the release of the new Sheet Metal Add-on as part of the recently released Creaform Metrology Suite.

  9. Release Of Compact Emissions Measurement System 'MEXAcube' 3/10/2025

    HORIBA, Ltd. is proud to release the new Compact Emissions Measurement System MEXAcube a solution to measure engine emissions equipped with HORIBA’s unique Infrared Laser Absorption Modulation (IRLAM) technology developed in 2021.

  10. Sandvik To Acquire 3D Metrology Software Provider Verisurf 3/10/2025

    Sandvik has signed an agreement to acquire Verisurf Software, Inc. (Verisurf), a US-based 3D metrology software solutions provider. Verisurf will complement and enhance Sandvik’s position in industrial metrology and strengthen the combined digital manufacturing offering to small and mid-sized manufacturers (SMEs).