Current Headlines
-
Koh Young Showcases Advanced Dimensional Metrology And Inspection Solutions For Semiconductor And Wafer-Level Packaging At SEMICON West
9/3/2025
Koh Young Technology, the industry leader in True 3D measurement-based dimensional metrology and inspection solutions, will present its latest advancements for semiconductor and advanced packaging applications at SEMICON West 2025 in Booth 5949.
-
LI-COR Launches New HOBO Multiparameter Data Loggers To Help Growers And Researchers Make Data-Driven Decisions With Confidence
8/28/2025
LI-COR, a global leader in environmental measurement and monitoring solutions, announces the launch of two new HOBO® Data Loggers designed to help growers, researchers, and AgTech innovators make faster and more informed decisions with confidence: the HOBO MX2308 Temp/RH/PAR Data Logger and the HOBO MX2309 Temp/RH/Solar Data Logger.
-
Renishaw Introduces Powerful MODUS IM Equator Intelligent Metrology Software
8/28/2025
Renishaw, a global leader in engineering technologies, will introduce its new MODUS IM Equator software at EMO Hannover 2025.
-
Nova Announces The Release Of Nova WMC: A Next-Generation Modular Optical Metrology Platform For Advanced Packaging
8/26/2025
Nova (NASDAQ: NVMI), today announced the release of its latest optical metrology solution, the Nova WMC. This next-generation modular platform has been specifically designed to address the complex requirements of the most advanced packaging applications in semiconductor manufacturing.
-
Bowers Group Launches New Bluetooth-Enabled Digital Caliper And Smart Inspection Software
8/4/2025
Bowers Group has unveiled its latest advancement in connected metrology, launching the new Bowers BT 150mm Caliper and the powerful new Bowers Connect software.
-
Length Measurement Technology: Interface Standard Boosts Automation
8/1/2025
Coordinate measuring machines and measurement software from different manufacturers are increasingly speaking the same language.
-
3D Quality Inspection In Coordinate Measuring Machines
7/21/2025
Laser profile scanners from the scanCONTROL series are used in coordinate measuring machines for quality assurance and reverse engineering.
-
AMETEK Completes Acquisition Of FARO Technologies, Strengthening Leadership In 3D Metrology, Laser Projection & Digital Reality Solutions
7/21/2025
AMETEK, Inc. today announced that it has completed its acquisition of FARO Technologies, a global leader in 3D measurement and imaging solutions.
-
Keysight Introduces An Enhanced Electromagnetic Interference Test Receiver With Real-Time, Gapless 1 GHz Measurement Bandwidth
7/17/2025
Keysight Technologies, Inc. announced a major enhancement to its PXE Electromagnetic Interference (EMI) Receiver, extending the wideband Time Domain Scan (TDS) with a real-time, gapless measurement capability up to 1 GHz measurement bandwidth.
-
LK Metrology Expands Into Industrial CT By Acquiring Procon X-Ray
7/9/2025
Best known as a manufacturer and global supplier of coordinate measuring machines (CMMs) and more recently laser scanning sensors, LK Metrology announces the acquisition of ProCon X-Ray GmbH, a specialist German manufacturer of computed tomography (CT) systems.