PVA TePla Expands Metrology Portfolio Through Strategic Cooperation With SENTECH Instruments

• Cooperation expands product portfolio with a non-destructive optical measurement method for the thickness and homogeneity of semiconductor coatings
• PVA TePla and SENTECH jointly develop the systems, production and global sales are carried out by PVA TePla
• First applications from this cooperation will address the global semiconductor market from 2026

PVA TePla, the leading provider of high-tech solutions in the fields of materials and metrology technology, and SENTECH Instruments, a renowned German provider of plasma technology and ellipsometry (coating thickness measurement), today announced a strategic cooperation. As part of this exclusive partnership, PVA TePla and SENTECH are developing metrology systems for ellipsometry that address the volume market for silicon-based semiconductors.

“With SENTECH, we have found the ideal partner to expand our metrology portfolio with a key technology for customers in the semiconductor market,” says Jalin Ketter, CEO of PVA TePla. “This is another milestone in the implementation of our growth strategy, through which we are specifically addressing the rapidly growing global market for metrology and continuously expanding our product offering.”

The jointly developed pilot product is a metrology system for the optical inspection of layer thicknesses in semiconductor production. The homogeneity of the layers applied to the wafer is crucial for subsequent flawless functionality, which is why the technology is an indispensable part of quality and process control for all semiconductor manufacturers.

“We are very pleased about the cooperation with PVA TePla and look forward to further development collaboration,” emphasizes Friedrich Witek, Co-CEO of SENTECH Instruments. “By combining our joint innovative strength with PVA TePla's comprehensive sales network, we are creating an excellent basis for joint success.”