LATEST HEADLINES

• Onto Innovation Adds Overlay Metrology Capability With The Acquisition Of Inspectrology, LLC

  Onto Innovation Inc. today announced that it has acquired Inspectrology, LLC. Headquartered in Sudbury, Massachusetts, USA, Inspectrology is a leading supplier of overlay metrology for controlling lithography and etch processes in the compound semiconductor market.

• Autonomous In-Space Assembly And Manufacturing Moves Closer To Reality

  COSM Advanced Manufacturing Systems today announced that it will begin working on final development and build of electron beam 3D metal printing systems for a variety of future in-space, lunar, and Martian applications.

• k-Space Offers A New Accessory For Their In situ Metrology Tools

  k-Space is proud to announce the addition of a new accessory, kSA Insight, for their metrology tools. This tool allows researchers and operators to view their wafers and platen in real-time from within the k-Space software.

• Perceptron Completes Merger With Atlas Copco

  Perceptron, Inc. (NASDAQ: PRCP), a leading global provider of 3D automated metrology solutions and coordinate measuring machines, today announced receiving all regulatory approvals and the successful closing of the previously announced Agreement and Plan of Merger with Atlas Copco, a world-leading provider of sustainable productivity solutions headquartered in Stockholm, Sweden.

• New V15 Software Release Brings Additional 5-Axis Improvements And More

  Metrologic Group is proud to announce the release of the new version of Metrolog X4 and Silma X4, integrating new features for an improved user experience and more efficient 3D measurement.

• Noisecom Introduces Industry Leading 110 GHz Coaxial Noise Source For Advanced Millimeter Wave Product Development And Test

  Wireless Telecom Group, Inc. (NYSE American: WTT), announced today that it has introduced two new specialized millimeter wave noise generation solutions under their Noisecom brand.