Mitutoyo America Corporation is pleased to announce the release of the latest Rockwell Hardness Testers in its HR-530 Series, including the HR-530 (maximum specimen size height: 250 mm; depth: 150 mm) and the HR-530L (maximum specimen size height: 395 mm; depth 150 mm)
Nikon Metrology announced recently that ASF Metrology intends to acquire Nikon Metrology’s coordinate measuring machines (CMM) business. The closing of the transaction is expected to take place in about 2 months.
Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control solutions, today announced that a domestic China 3D-NAND manufacturer has selected Nanometrics for fab-wide process control. Nanometrics’ suite of substrate, thin film and critical dimension metrology solutions, including QS3300 FTIR, Atlas® II+, IMPULSE®+ and NanoDiffract® software, will be deployed for critical 3D-NAND device measurement and control
FARO® (NASDAQ: FARO), the world's most trusted source for 3D measurement and imaging solutions for factory metrology, product design, construction BIM/CIM, public safety-forensics and 3D machine vision applications, introduces the next generation FARO® Design ScanArm® 2.0, http://www.faro.com/products/product-design/faro-design-scanarm/ specifically designed to address the most demanding challenges and requirements faced by product design and product engineering professionals
Nanoscience Instruments is proud to partner with KLA-Tencor to offer the MicroXAM-800 optical profiler a white light interferometer. For more than 15 years, Nanoscience Instruments has provided advanced instrumentation and applications consulting for microscopy and surface analysis techniques
ShapeGrabber today announced the release of its SGCentral Version 10 software. The software has a wide range of features, APIs, and tools that power ShapeGrabber's automated 3D scannersand allow users to rapidly set up, scan, and measure complex-shaped parts in minutes.