Current Headlines

  1. New Version: Major Enhancements To Speed Up Production Quality And Efficiency 12/3/2025

    With this new release, Metrologic Group is pleased to announce a series of major innovations and optimizations for its entire product range.

  2. Revopoint Launches Revo Measure: PTB-Certified 3D Measurement Software Sets New Industry Standard 12/2/2025

    Revopoint, a global leader in advanced and easy-to-use 3D scanning solutions, is proud to announce the official launch ofRevo Measure, a professional-grade 3D measurement and analysis software that has received certification from Germany's Physikalisch-Technische Bundesanstalt (PTB), the world's leading institution for metrology standards.

  3. New Benchmarks In Quality Inspection And Data Analysis 11/20/2025

    ZEISS Industrial Quality Solutions (ZEISS IQS) announces the latest software updates for ZEISS INSPECT and ZEISS PiWeb, addressing the growing challenges of industrial quality control.

  4. Nearfield Instruments Signs Multi-Year Development Project To Advance Semiconductor Metrology 11/18/2025

    Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today announced a strategic development project to accelerate innovation in semiconductor metrology.

  5. MTI's Proforma 300iSA Combines SEMI And ASTM Standard Compliance In Space-Efficient Benchtop Design 11/18/2025

    Vitrek, a leading U.S. designer of precision measurement systems, has introduced the MTI Instruments Proforma 300iSA Semi-Automated Metrology System. The benchtop system delivers full SEMI and ASTM compliance in a compact footprint—offering laboratory-grade precision without the space demands of traditional floor-mounted equipment.

  6. Wooptix Launches New Phemet® In-Line Semiconductor Wafer Metrology Fab Solution With Industry-Leading Speed And Resolution 11/18/2025

    Wooptix, an innovation leader in semiconductor wavefront phase imaging metrology, today introduced its new Phemet® metrology system that provides ultra-fast and extremely accurate wafer shape and geometry measurements with sub-nanometer resolution.

  7. Creaform Unveils The CUBE-R M Series: Elevating Automated Dimensional Inspection Through Modularity And Tailored Options 11/11/2025

    Creaform, a business of AMETEK, Inc. and worldwide provider of automated and portable 3D measurement solutions, announced today the next evolution in automated quality control for at-line inspection in mass production: the CUBE-R M Series.

  8. Miraclon Announces FLEXCEL NX Central Software 3.0 To Supercharge FLEXCEL Plates 11/5/2025

    Miraclon today announces the release of FLEXCEL NX Central 3.0, the latest evolution of its centralized software hub for FLEXCEL plate production.

  9. AMAX Introduces Next Generation Industrial AI Platforms For Semiconductor Metrology 11/5/2025

    AMAX, a leading solution provider and designer of industrial AI and HPC solutions for the semiconductor industry, today announced the launch of its next generation HPC and AI compute platform engineered for advanced metrology applications.

  10. The HEH Group Expands Metrology Offerings Through New Partnership With Mahr 11/4/2025

    Mahr Inc., a leading provider of dimensional metrology solutions, today announced that the HEH Group and its companies, Motch & Eichele and Crotts & Saunders, have entered into a new agreement to distribute Mahr’s line of precision metrology equipment.