Current Headlines

  1. Accumeasure Capacitive Wafer Measurement Tools Reduce Start-Up Costs For Specialty Fabs & Their Tier Ones 2/5/2026

    Vitrek, a US-based leader in precision measurement instruments, today announced the expanded capabilities of its MTI Accumeasure Capacitance Technology.

  2. SHINING 3D Metrology Expands FreeScan Omni Into A Modular Metrology Series 2/5/2026

    As industrial environments become more dynamic, professionals across automotive, civil aviation, and heavy machinery sectors increasingly demand metrology solutions that are mobile, flexible, and easy to deploy.

  3. NEXIV Software 'AutoMeasure' Makes Creating Measurement Programs Easier 2/4/2026

    Nikon Corporation (Nikon) has launched the newest version of NEXIV software “AutoMeasure”. Dedicated to the NEXIV VMZ-S series, VMZ-H3030, and iNEXIV VMA series, “AutoMeasure” has evolved significantly from previous versions, incorporating innovative features that make measurement easier for anyone.

  4. Siemens Acquires Canopus AI To Bring AI-Based Metrology To Semiconductor Manufacturing 2/4/2026

    Siemens today announced the acquisition of Canopus AI, an innovator in computational and AI-driven metrology solutions, enabling semiconductor manufacturers to achieve new levels of precision and efficiency in wafer and mask inspection processes.

  5. NPL To Establish New Centre For AI Measurement 1/29/2026

    The UK Government has today announced the establishment of a new Centre for AI Measurement, to be led by NPL. The centre is a cornerstone of the AI Assurance Innovation Fund, designed to accelerate the development of secure, transparent and trustworthy AI technologies.

  6. Nova Announces Adoption Of Metrion® By Two Leading Global Manufacturers 1/29/2026

    Nova (Nasdaq:NVMI) a leading innovator in metrology and process control solutions for advanced semiconductor manufacturing, today announced the adoption of its Nova Metrion® platform by global leaders in Memory and Logic device production.

  7. CRAIC Technologies Introduces Updated 508PV Microscope Spectrophotometer For Semiconductor Metrology 1/29/2026

    CRAIC Technologies, the global leader in UV-Visible-NIR microspectroscopy, today announced significant technology updates to the 508PV Microscope Spectrophotometer, designed to meet the precision demands of semiconductor fabs and R&D laboratories.

  8. IndySoft Expands Global Footprint To Support Enterprise-Scale Measurement-Driven Asset Management 1/29/2026

    IndySoft (www.indysoft.com), a global leader in calibration and asset management software, is excited to announce the expansion of its global operations with new offices and dedicated teams in the UK, Germany, India, and Brazil.

  9. Koh Young To Showcase Advanced Inspection At SEMICON Korea 2026 1/26/2026

    Koh Young, the industry leader in True 3D measurement-based inspection and metrology solutions, will exhibit at SEMICON Korea 2026, held February 11–13, 2026 at COEX in Seoul.

  10. X-Rite And Rhopoint Launch Rhopoint PANTORA Aesthetix® To Streamline Creation Of Digital Material Twins 1/14/2026

    X-Rite Incorporated, a global leader in color science and technology, today announced a new collaboration with Rhopoint Instruments, a leading manufacturer of test equipment for appearance quality, to advance digital appearance innovation and support the growing use of digital twins in product development and marketing.