Current Headlines

  1. A Resounding Success And Ongoing Commitment | Scanology's Advanced 3D Metrology Solutions Shine At Formnext 2025 12/6/2025

    The curtains have closed on Formnext 2025 in Frankfurt, the world’s leading exhibition for Additive Manufacturing (AM) and modern industrial production.

  2. Large Volume CMM: New MAXIMA Table And Twin-Rail Version Available 12/5/2025

    LK Metrology introduces the MAXIMA and MAXIMA R ranges of large bridge CMMs, for precise measurement of the largest and heaviest parts.

  3. Rigaku Launches XTRAIA MF-3400, A Measuring Instrument For Next-Generation Semiconductors 12/4/2025

    Rigaku Corporation, a global solution partner in X-ray analytical systems and a group company of Rigaku Holdings Corporation (headquarters: Akishima, Tokyo; CEO: Jun Kawakami; hereinafter “Rigaku”) has launched the XTRAIA MF-3400, an instrument used in semiconductor manufacturing processes to measure the thickness and composition of wafers.

  4. KPM Analytics Enhances NIR Analyzers With New Ready-To-Use NIR Calibration Packages To Simplify Food & Feed Quality Analysis 12/4/2025

    KPM Analytics today announced the release of 10 new Near-Infrared (NIR) Calibration Packages for its SpectraStar™ XT NIR Analyzer Series.

  5. Nikon Announces Enhancements To XT V Series X-ray And CT Systems 12/4/2025

    Nikon Corporation (Nikon) has announced a comprehensive suite of enhancements to its XT V Series X-ray and CT systems, strengthening the platform’s position as a world-class solution for non-destructive inspection of electronic components.

  6. New Version: Major Enhancements To Speed Up Production Quality And Efficiency 12/3/2025

    With this new release, Metrologic Group is pleased to announce a series of major innovations and optimizations for its entire product range.

  7. Revopoint Launches Revo Measure: PTB-Certified 3D Measurement Software Sets New Industry Standard 12/2/2025

    Revopoint, a global leader in advanced and easy-to-use 3D scanning solutions, is proud to announce the official launch ofRevo Measure, a professional-grade 3D measurement and analysis software that has received certification from Germany's Physikalisch-Technische Bundesanstalt (PTB), the world's leading institution for metrology standards.

  8. New Benchmarks In Quality Inspection And Data Analysis 11/20/2025

    ZEISS Industrial Quality Solutions (ZEISS IQS) announces the latest software updates for ZEISS INSPECT and ZEISS PiWeb, addressing the growing challenges of industrial quality control.

  9. Nearfield Instruments Signs Multi-Year Development Project To Advance Semiconductor Metrology 11/18/2025

    Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today announced a strategic development project to accelerate innovation in semiconductor metrology.

  10. MTI's Proforma 300iSA Combines SEMI And ASTM Standard Compliance In Space-Efficient Benchtop Design 11/18/2025

    Vitrek, a leading U.S. designer of precision measurement systems, has introduced the MTI Instruments Proforma 300iSA Semi-Automated Metrology System. The benchtop system delivers full SEMI and ASTM compliance in a compact footprint—offering laboratory-grade precision without the space demands of traditional floor-mounted equipment.