Latest Headlines

  1. Aircraft Brake Calipers Market Opportunity Analysis And Industry Forecast, 2020-2030 12/14/2021

    Aircraft brackets are basically structures that are attached to various components in an aircraft and serve as a supporting component over the other components

  2. Deepen AI Launches Radar And IMU Sensor Calibration; Loop-Based Optimizer Brings Increased Accuracy 12/13/2021

    Deepen AI, a world leader in computer vision tools for autonomous systems, today announced the launch of Radar and IMU sensor calibrations

  3. Metrology 4.0 - A Collaboration Driving Roundness Metrology Forward 11/22/2021

    Digital Surf and Taylor Hobson, world leader in surface and form metrology, have a common history dating back almost 30 years

  4. Peak Metrology Partners With IDC MicroInspection 11/22/2021

    Peak Metrology, a surface metrology capital equipment manufacturer, today announced the partnership with IDC MicroInspection

  5. New Rohde & Schwarz radome Tester Delivers Fast, Accurate And Cost-Effective Production Line Measurements 11/16/2021

    The new R&S QAR50 from Rohde & Schwarz is the ideal solution for measuring radomes and bumpers in production. The tester's innovative design ensures short measurement times and accurate, reproducible results with a very attractive price/performance ratio

  6. Nova Expands Into Advanced Chemical Metrology With ancosys Acquisition 11/16/2021

    Nova (Nasdaq: NVMI) announced today that it has entered into a definitive agreement to acquire ancosys GmbH, a privately  held company headquartered in Pliezhausen Germany, in an all-cash transaction valued at approximately $100 million, including a performance based earnout of $10 million

  7. Covalent Metrology Installs The Latest FIB/SEM Lamella Sample Preparation Instrument 11/15/2021

    Covalent Metrology, a leading North American provider of analytical services, announces the installation of a new Thermo Scientific Helios 5 UX DualBeam Focused Ion Beam Scanning Electron Microscope

  8. Powerful New Semiconductor Tool Introduced By Park Systems Combines Atomic Force Microscopy With White Light Interferometry 11/15/2021

    Park Systems, a world leading manufacturer of Atomic Force Microscopes, presents Park NX-Hybrid WLI, the first fully integrated system that combines Atomic Force Microscopy (AFM) with White Light Interferometer (WLI) profilometry

  9. EV Group Brings High-Speed High-Precision Metrology To 3D Heterogeneous Integration 11/15/2021

    EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today unveiled the EVG®40 NT2 automated metrology system, which provides overlay and critical dimension (CD) measurements for wafer-to-wafer (W2W), die-to-wafer (D2W) and die-to-die (D2D) bonding as well as maskless lithography applications

  10. Anritsu Introduces Rubidium™ Signal Generator Family Leading Market In Signal Purity And Frequency Stability With Exceptional Utility 11/15/2021

    Anritsu Company introduces the Rubidium™ signal generator family that delivers outstanding signal purity and frequency stability, even at high output power levels, across a broad frequency range of 9 kHz to 43.5 GHz. Coupled with built-in, easy-to-use, at-location frequency and power calibration capability, Rubidium offers exceptional overall utility and long-term value in a broad range of commercial and military/aerospace measurement applications.