Latest Headlines

31. APPLIED IMAGE Launches A New NIST Traceable Color Calibration Slide For Whole Slide Imagers 8/7/2020

    The new NIST Traceable, Whole Slide Imaging Color Transmission Calibration Standard (p/n IAM-9C-WSI) helps researchers calibrate, standardize, and trace color settings for imaging analysis.

32. Hexagon Enhances Part Loading Efficiency With New Large Volume CMM 8/6/2020

    Hexagon today released DELTA OPERA, the large volume CMM that simplifies loading of very large parts in industrial environments. DELTA OPERA’s unique open structure enables users to load workpieces from three sides of the CMM, making part loading quicker, more flexible, and protecting workpieces by avoiding collisions with the CMM structure.

33. FARO® Launches Trek, The Automated 3D Laser Scanning Integration With Boston Dynamics Spot® Mobile Robot 8/5/2020

    FARO Technologies, Inc. (NASDAQ: FARO), the global leader for 3D Metrology, AEC and Public Safety Analytics, today announced the release of FARO® Trek.

34. W Energy Software Launches Next Generation Oil & Gas Measurement Solution Backed By Industry Led Product Consortium 8/4/2020

    W Energy Software, the new leader in upstream and midstream oil & gas ERP solutions, announces the launch of its oil & gas measurement product line to track liquids and natural gas measurement data across the energy value chain.

35. TEGAM, Inc Announces Temperature Calibrators For SAE AMS2750F Pyrometry 7/28/2020

    TEGAM, Inc., the recent release of SAE AMS2750F Pyrometry has impacted the Metal Heat Treating Industry by requiring upgrades to their temperature measurement and calibration instruments. The TEGAM Model 945A meets the requirements in one convenient and portable instrument.

36. Wenzel And Nikon Metrology Enter Distribution Partnership 7/28/2020

    The distribution agreement between Nikon Metrology and WENZEL sees two of the biggest global players for metrology create a new partnership. This distribution partnership provides customers with the ultimate combination of innovative CMMs, with Nikon Metrology’s unequalled laser scanning technology.

37. Mahr Inc. Announces Exciting Updates To Its MarSurf CM Mobile Portable Optical Surface Metrology Tool 7/28/2020

    Mahr Inc., a global manufacturer of precision measurement equipment used for dimensional metrology, today announced the release of its newly-updated MarSurf CM mobile portable optical surface metrology tool.

38. Nova Unveils Next Generation Integrated Metrology Solutions 7/27/2020

    Nova (Nasdaq: NVMI) announced today two break-through Integrated Metrology solutions, reinforcing the company's Optical CD portfolio technology leadership. The new platforms, Nova i570 HP and Nova ASTERA, will enhance Nova's ability to support customers in the most advanced Memory and Logic nodes.

39. KLA Introduces Breakthrough Electron-Beam Defect Inspection System 7/20/2020

    Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to accelerate time-to-market for high-performance logic and memory chips, including those that rely on extreme ultraviolet (EUV) lithography, by detecting and reporting defects that cannot be routinely captured by optical or other e-beam defect inspection platforms.

40. Fairview Microwave Introduces New SOLT Calibration Kits With Four Additional Interconnect Options 7/1/2020

    Fairview Microwave Inc., an Infinite Electronics brand and a leading provider of on-demand RF, microwave and millimeter wave components, has unveiled a new series of short-open-load-through (SOLT) calibration kits designed for use in lab, test and measurement, and RF and Microwave production test applications.