Latest Headlines
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Fractilia Brings Stochastics Metrology To HVM Fabs To Improve EUV Patterning Control And Yields
2/21/2023
Fractilia, the leader in stochastics metrology and control solutions for advanced semiconductor manufacturing, today announced the latest addition to its Fractilia Automated Measurement Environment (FAME™) portfolio, the FAME 300. Designed specifically for use in high-volume manufacturing (HVM) fab environments, the FAME 300 provides real-time measurement, detection and monitoring of stochastic effects, which are the single largest source of patterning errors at advanced nodes.
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New Canon Wafer Measurement Equipment Improves Productivity Of Lithography Systems, Enabling High-Precision Alignment For Increasingly Complex Semiconductor Manufacturing Processes
2/21/2023
Canon Inc. announced today the launch in Japan of the MS-001, a high-precision wafer alignment1 measurement device for semiconductor lithography systems.
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Vaisala Launches A Pioneering Optical Inline Process Refractometer Series For Industrial Liquid Measurements
2/15/2023
The new robust platform of inline process refractometers adds to Vaisala’s leading-edge innovations by introducing the first fully inhouse developed refractometer series to product platform that combines both liquid and gas measurement capabilities.
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TDK Expands The Tronics AXO300 Series With Two Types Of High-Performance Digital MEMS Accelerometer Sensors
2/15/2023
TDK Corporation announces the extension of Tronics AXO300 accelerometers platform with two new products. After the successful production launch in 2020 of the ±14 g AXO315 accelerometer for high-performance navigation and positioning of dynamic systems, Tronics extends the AXO300 accelerometer series with AXO301, a low-noise and high-resolution ±1 g accelerometer for high precision acceleration/deceleration measurements in railway applications and inclination control in industrial applications, and AXO305, a ±5 g accelerometer tailored for navigation, positioning, and motion control of land and marine manned and unmanned systems.
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GTI Energy Launches Veritas Open-Source Protocols To Accelerate Methane Emissions Reductions
2/14/2023
Today, GTI Energy announced new open-source methane emissions measurement protocols to meet the urgent need to accurately measure and reduce methane emissions and accelerate the transition to a clean energy economy.
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Refeyn Launches SamuxMP Auto For Automated AAV Capsid Analysis
2/14/2023
Refeyn, the mass photometry pioneer, has announced the launch of its new SamuxMP Auto mass photometer, which reduces manual operation time while increasing reproducibility in adeno-associated virus (AAV) characterization.
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Exact Metrology Now Leases ZEISS METROTOM 1 CT Scanner
2/13/2023
Exact Metrology: A Division of In-Place Machining Company, a comprehensive 3D metrology service provider and hardware sales company, is leasing the ZEISS METROTOM 1 CT scanner. The METROTOM 1 allows users to measure and inspect hidden defects and internal structures that can’t be detected with tactile measuring systems.
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Digital 3D Touch Sensor Wins Hexagon’s Support To Scale And Solve Industry Challenges
2/3/2023
Hexagon has announced the winner of the second cohort of its coveted Sixth Sense open innovation platform, which nurtures start-ups creating solutions to pressing manufacturing challenges.
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Tenneco's Powertrain Business Adds Hydrogen To Its Strong Alternative Fuels Engine-Testing Capabilities
2/1/2023
Tenneco has established new test facilities for hydrogen-powered internal combustion engines at its Powertrain test centers in Burscheid, Germany, and Ann Arbor, Michigan.
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ZEISS T-SCAN hawk 2: The tool To Get About Anything Done
2/1/2023
ZEISS #HandsOnMetrology introduces the new ZEISS T-SCAN hawk 2, developed and produced in Germany and certified for the highest industry standards. ZEISS T-SCAN hawk 2 is a portable, reliable tool to capture data with metrology-grade precision wherever needed: in quality control or reverse engineering, maintenance, repair and overhaul.