Latest Headlines
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Sandvik Completes The Acquisition Of Verisurf
6/3/2025
Sandvik has completed the previously announced acquisition of Verisurf Software Inc. ("Verisurf"), a US-based 3D metrology software solutions provider.
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Instron Launches New AVE3 Advanced Video Extensometer
5/28/2025
Instron is excited to announce the release of the AVE3, an advanced non-contacting video extensometer that delivers precise strain measurement with unparalleled, micron-level accuracy for tensile, compression, and bend testing.
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Measurement Technology For Efficient Process Optimization And Quality Assurance In Medical Technology
5/27/2025
At automatica 2025 (June 24 to 27 in Munich, Germany), Kistler will be presenting a broad product portfolio for automated manufacturing processes – or those on the way to being automated –at booth 205 in hall B5.
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ZEISS Introduces ScanPort, A New Dimension In Semi-Automated 3D Metrology
5/27/2025
With ZEISS ScanPort, ZEISS presents an innovative, powerful solution in optical 3D metrology that combines accuracy, flexibility, and ease of use in a compact system.
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Hexagon And PRAGMA Forge Partnership To Advance Portable NDT And Metrology Solutions
5/20/2025
Hexagon’s Manufacturing Intelligence division and PRAGMA proudly announce an evolution of their existing partnership, designed to deliver unprecedented portability in Non-Destructive Testing (NDT) by integrating cutting-edge inspection capabilities with Hexagon's advanced portable metrology solutions.
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Nearfield Instruments And Singapore's A*STAR IME Sign Research Collaboration Agreement To Advance Semiconductor Metrology Solutions For AI And Advanced Packaging Era
5/20/2025
Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies.
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X-Rite Launches CiF3200 Imaging Benchtop Spectrophotometer For Precision Small-Spot Color Measurement
5/15/2025
X-Rite Incorporated, a global leader in color science and technology, today announced the launch of the CiF3200 imaging spectrophotometer, designed for color measurement of small, odd-shaped, multi-colored, and highly reflective items.
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Mahr Inc. Introduces Mar4D PLQ 4200 Cylinder Coordinate Measuring Machines For Complex Symmetrical Workpieces
5/15/2025
Mahr Inc., a leading provider of dimensional metrology solutions, announced the Mar4D PLQ 4200 line of cylinder coordinate measuring machines.
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SIKORA At Interwire 2025: Precise Measuring, Control And Sorting Technology (Booth 1639)
5/14/2025
With the new CENTERVIEW PRO, SIKORA takes the eccentricity measurement to a new level. The models CENTERVIEW 10 and CENTERVIEW 25 for diameters from 0.1 to 25 mm measure the eccentricity, diameter and ovality of cables with up to 5,000 highly precise measuring values per second per axis.
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Seeing Beyond Circularity: Detecting Shape Distortions In Continuous Casting And Rolling
5/8/2025
Laserlinc Inc. has introduced a groundbreaking approach to shape-measurement, for continuous casting and rolling applications, enhancing precision in metal processing.