Latest Headlines

  1. TrackScan Sharp Series Optical 3D Scanning System 9/2/2024

    The TrackScan Sharp series is a cutting-edge optical 3D scanning system powered by SCANTECH, engineered with 25-megapixel industrial cameras and advanced onboard processors for edge computing. This system is specifically designed to measure large-scale parts over long distances with remarkable speed and precision.

  2. DefinSight All-In-One Metrology 3D Software Platform 8/29/2024

    DefinSight is an all-in-one metrology 3D software platform designed to use the full potential of Scantech's state-of-the-art 3D technology.

  3. First In Japan To Achieve 600 V/m In Accredited Field Probe Calibration 8/28/2024

    TOYO Corporation announced that its calibration laboratory is the first in Japan to extend field strength to 600 V/m (volts per meter) for calibrating field probes used in immunity testing of in-vehicle electronic devices.

  4. Zygo Headlines With Innovative 3D Optical Metrology Systems At IMTS 2024 8/26/2024

    Zygo Corporation, a business unit of AMETEK, Inc., will be showcasing their range of 3D optical profilers at the IMTS event in Chicago.

  5. Elevating 3D Characterization With Enhanced Performance And Efficiencies 8/26/2024

    Today, ZEISS launches its latest innovation in the field of X-ray microscopy: ZEISS VersaXRM 730. The new system offers researchers an unprecedented level of performance, choice, and accessibility.

  6. Measurement Of Battery Cells With TomoScope S Plus 8/21/2024

    The TomoScope S Plus and Werth longlife transmission sources with X-ray voltages of up to 240 kV enable fast measurements with high resolution.

  7. Autel Launches The MaxiSYS IA700 ADAS Calibration Frame System 8/14/2024

    Autel, a leading developer, manufacturer, and distributor of professional automotive diagnostic tools and equipment, has released its latest Advanced Driver Assistance System (ADAS) calibration solution.

  8. Gauss Labs Releases AI-Based Virtual Metrology Solution, Panoptes VM 2.0 8/12/2024

    Gauss Labs announced today that it released the second version of its AI-based virtual metrology* solution, Panoptes VM 2.0.

  9. MeitY's R&D Institute SAMEER Transfers Technology For Sugar Content Measurement To Two Private Entities 8/10/2024

    Society for Applied Microwave Electronics Engineering & Research (SAMEER), a R&D Institute of MeitY, Government of India, signed a Transfer of Technology (ToT) agreement for Microwave based insitu BRIX measurement system with Toshniwal Hyvac Pvt. Ltd. and Sir Automation Industries to enable manufacturing of this system in large numbers.

  10. STAr Sagittarius Series Intelligent Integrated Test System 8/9/2024

    STAr Sagittarius Series, launched in 2001, is an intelligent test software designed for semiconductor parametric and reliability test and enables to integrate capacitance-voltage (CV) and current-voltage (IV) measurements into one single platform.