Fluke Corp, a wholly owned subsidiary of Fortive Corporation and a global leader in test and measurement instruments, has acquired California-based Solmetric, a market leader in high precision, solar test, and measurement products.
EMCORE Corporation (Nasdaq: EMKR), the world’s largest independent provider of inertial navigation solutions to the aerospace and defense industry, announced today the introduction of the TAC-440 MEMS Inertial Measurement Unit (IMU), the world’s smallest 1°/hour IMU.
The eagerly awaited 2023 Taipei Aerospace & Defense Technology Exhibition opens on September 14th. Backed by the Value Creation Programs for Start-up Teams in Universities of National Science and Technology Counci, Ohmplus Technology Inc.(hereinafter referred to as Ohmplus), a spin-off from National Taiwan University, is set to showcase its OHM+ Fast technology, driving innovation at the event.
Adtran today announced that one of the world’s leading metrology institutes has conducted a three-month-long evaluation of its OSA 3300-HP high-performance optical cesium atomic clock. Based in Central Europe, the national laboratory tested Adtran’s industry-first solution to establish its suitability for scientific measurement and calibration applications that require precise synchronization.
A licensing agreement between the Department of Energy’s Oak Ridge National Laboratory and research partner ZEISS will enable industrial X-ray computed tomography, or CT, to perform rapid evaluations of 3D-printed components using ORNL’s machine learning algorithm, Simurgh. Incorporating machine learning into CT scanning is expected to reduce the time and cost of inspections by more than ten times while improving quality.
Nordson TEST & INSPECTION today announced its participation in SEMICON Taiwan, one of the most anticipated events in the semiconductor industry. The company will be showcasing its state-of-the-art inspection and metrology solutions, including the CyberOptics SQ3000+ Multi-Function system, the new Quadra 7 Pro Manual X-ray Inspection (MXI) System, and the revolutionary WaferSense Auto Teaching System (ATS2).
CRAIC Technologies, a leading innovator in scientific instrumentation for microscopy and microanalysis, is proud to announce the release of the GeoImage Imaging Photometer for Vitrinite Reflectance Measurements.
The Industrial Metrology Business Unit of Nikon Corporation has released the automatic wafer measurement system NEXIV VMZ-NWL 200 to solve the challenges of wafer metrology in the semiconductor back-end process, where more work is traditionally carried out manually than in front-end process control.