Latest Headlines
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Fluke Corp. Acquires Solar Test And Measurement Leader, Solmetric
9/12/2023
Fluke Corp, a wholly owned subsidiary of Fortive Corporation and a global leader in test and measurement instruments, has acquired California-based Solmetric, a market leader in high precision, solar test, and measurement products.
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EMCORE Introduces New TAC-440 MEMS Inertial Measurement Unit
9/11/2023
EMCORE Corporation (Nasdaq: EMKR), the world’s largest independent provider of inertial navigation solutions to the aerospace and defense industry, announced today the introduction of the TAC-440 MEMS Inertial Measurement Unit (IMU), the world’s smallest 1°/hour IMU.
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Ohmplus Technology Inc. | Show The Fast Measurement And Automatic Calibration Solution Derived From Its Core Technology At 2023 Taipei Aerospace & Defense Technology Exhibition
9/8/2023
The eagerly awaited 2023 Taipei Aerospace & Defense Technology Exhibition opens on September 14th. Backed by the Value Creation Programs for Start-up Teams in Universities of National Science and Technology Counci, Ohmplus Technology Inc.(hereinafter referred to as Ohmplus), a spin-off from National Taiwan University, is set to showcase its OHM+ Fast technology, driving innovation at the event.
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Adtran’s Oscilloquartz Optical Cesium Clock Outperforms In Tests At Leading European Metrology Institute
9/5/2023
Adtran today announced that one of the world’s leading metrology institutes has conducted a three-month-long evaluation of its OSA 3300-HP high-performance optical cesium atomic clock. Based in Central Europe, the national laboratory tested Adtran’s industry-first solution to establish its suitability for scientific measurement and calibration applications that require precise synchronization.
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SHINING 3D Establishes New Accuracy Laboratory Accredited Under ISO/IEC 17025:2017
9/1/2023
On August 26th, SHINING 3D, a pioneer in 3D scanning and printing solutions, announced the establishment of its new Accuracy Laboratory in Hangzhou, China.
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ZEISS, ORNL Sign Licensing Agreement For Inspection Of 3D-Printed Parts
8/29/2023
A licensing agreement between the Department of Energy’s Oak Ridge National Laboratory and research partner ZEISS will enable industrial X-ray computed tomography, or CT, to perform rapid evaluations of 3D-printed components using ORNL’s machine learning algorithm, Simurgh. Incorporating machine learning into CT scanning is expected to reduce the time and cost of inspections by more than ten times while improving quality.
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Nordson TEST & INSPECTION Showcases State-Of-The-Art Inspection And Metrology Solutions At SEMICON Taiwan
8/28/2023
Nordson TEST & INSPECTION today announced its participation in SEMICON Taiwan, one of the most anticipated events in the semiconductor industry. The company will be showcasing its state-of-the-art inspection and metrology solutions, including the CyberOptics SQ3000+ Multi-Function system, the new Quadra 7 Pro Manual X-ray Inspection (MXI) System, and the revolutionary WaferSense Auto Teaching System (ATS2).
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Saelig Introduces Permaflow Clamp-On, Non-Invasive Transit Time Ultrasonic Flow Meter
8/28/2023
Saelig Company, Inc. has introduced the Coltraco Permaflow Ultrasonic Transit-time Flow and Heat Meter, which uses a pair of clamp-on ultrasonic transducers to non-invasively monitor fluid flow rates.
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CRAIC Technologies Launches GeoImage Imaging Photometer For Vitrinite Reflectance Measurements
8/28/2023
CRAIC Technologies, a leading innovator in scientific instrumentation for microscopy and microanalysis, is proud to announce the release of the GeoImage Imaging Photometer for Vitrinite Reflectance Measurements.
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Wafer Automatic Measurement Solution Supports The Measurement Required For Back-End Process Control
8/24/2023
The Industrial Metrology Business Unit of Nikon Corporation has released the automatic wafer measurement system NEXIV VMZ-NWL 200 to solve the challenges of wafer metrology in the semiconductor back-end process, where more work is traditionally carried out manually than in front-end process control.