Latest Headlines

1. Renishaw Announces Expanded CMM Software Offering With New Verisurf Agreement In North America 11/9/2021

   Renishaw has entered into an agreement with Verisurf Software Inc., allowing companies in North America to access Verisurf coordinate measuring machine (CMM) software from Renishaw. With an emphasis on the popular Verisurf CMM Programming and Inspection Suite, this agreement enables companies to benefit from Renishaw’s advanced inspection technologies, including the REVO 5 axis measuring system and the Equator flexible gauging system, and the support networks of both organizations.

2. k-Space Received A Large Solar Panel Edge Profile Metrology Order 11/9/2021

   k-Space Associates, Inc. is excited to announce that they recently received a large order for solar panel edge profile metrology systems.

3. ITRI And Oxford Instruments Foster Cooperation On Semiconductor Measurement Technology 11/4/2021

   Semiconductor manufacturers moving into the 2 nm process are facing challenges in accurately measuring the dimensions of key components, such as transistor structure, size, and film thickness. Based on industry's demand for state-of-the-art measurements for in-vehicle electronics and a new generation of semiconductors, the Department of Industrial Technology (DoIT) under the Ministry of Economic Affairs (MOEA) has coordinated with the British Office Taipei in jointly promoting cooperation between ITRI and Oxford Instruments.

4. Covalent Metrology Announces New Semiconductor Consulting Practice Group 11/4/2021

   Covalent Metrology, a leading North American analytical services company located in the heart of Silicon Valley, announced that it has formed a new Semiconductor Consulting practice group, and that Dr. Yihung Lin, a recognized leader in semiconductor metrology, has joined Covalent to lead the new initiative.

5. CyberOptics Receives Two Awards For New SQ3000+ Multi-Function And WX3000 Systems During SMTAI 11/3/2021

   CyberOptics Corporation, a leading global developer and manufacturer of high-precision 3D sensing technology solutions, received two 2021 Mexico Technology Awards in the categories of Inspection for its SQ3000+ Multi-Function system for AOI, SPI and CMM, and Metrology for its WX3000 Metrology and Inspection System.

6. Updated PolyWorks Interface For Hexagon Structured Light Scanners 10/26/2021

   Hexagon’s Manufacturing Intelligence division today announced the release of a new updated version of their dedicated software plugin for the powerful third-party inspection software platform PolyWorks. Launched in October 2020, the SLS-PW Plug-in allows full operation of Hexagon structured light scanning systems from directly within the PolyWorks environment. This latest version includes a range of new features, including extended exposure functionality, an updated graphical user interface and workflow tools based on PolyWorks macro scripting language.

7. Creaform Introduces Three New Solutions To The R-Series™ Suite Of Automated Dimensional Quality Control Solutions 10/19/2021

   Creaform, the worldwide leader in portable 3D measurement solutions and engineering services, announced today the latest additions to its R-Series lineup, including a new MetraSCAN-R BLACK | Elite HD with improved performance as well as a new edition of VXelements designed for long-term support (LTS). This state-of-the-art set of solutions also includes a new version of VXscan-R module specially made to accommodate custom automated 3D scanning cell layouts, while keeping the ease of use of its digital twin programming software.

8. Simplified CMM Inspection Provides A Flexible Approach To More Productive Quality Control 10/18/2021

   LK Launchpad makes it simple to load the correct program for inspecting a component, which is easily identified from icons on a touch- screen. The easy-to-use graphical interface enables not only the two WLR quality inspectors and quality manager Tony Blood to load parts singly or in batches onto an LK CMM, but also the 10 day-shift and 5 night-shift machine operators.

9. Applied Materials Unveils eBeam Metrology System That Enables A New Playbook For Patterning Advanced Logic And Memory Chips 10/18/2021

   Applied Materials, Inc. today unveiled a unique eBeam metrology system that enables a new playbook for patterning control based on massive on-device, across-wafer and through-layer measurements.

10. ZYGO Launches Verifire Asphere+: Fast, Flexible, And Precise Asphere Metrology 10/14/2021

    Optical metrology leader Zygo Corporation — a business unit of Ametek Inc. — announces today that it will be revealing its Verifire Asphere+ — which represents the latest addition to the company’s Verifire series of laser Fizeau interferometers — at the SPIE.OPTIFAB event 18-21 October 2021 in Rochester, NY, USA.