Business Wire
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Mitutoyo America Corporation Releases New SJ-220 Portable Surface Roughness Tester
3/26/2025
Mitutoyo America Corporation, a leading manufacturer of precision metrology instruments and solutions, is proud to announce the release of the new Surface Roughness Tester SJ-220 Series to our vast line of Form Measuring Instruments, providing compatibility and versatility to meet the diverse needs of manufacturing sites.
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Thermo Fisher Scientific Introduces The Vulcan Automated Lab To Transform Semiconductor Analysis
3/18/2025
Thermo Fisher Scientific Inc. (“Thermo Fisher”), the world leader in serving science, today announced the launch of the Thermo Scientific Vulcan Automated Lab, a groundbreaking solution designed to drive a new era of process development and control in semiconductor manufacturing.
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ArcBest Introduces Vaux Vision And Enhancements To Vaux Technology Suite
2/10/2025
ArcBest, an integrated logistics company, today announced the introduction of its latest technology offering, Vaux Vision, which is currently in the pilot phase. Vaux Vision transforms forklifts into intelligent mobile dimensioners to improve material handling efficiencies.
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New Level And Density Gauges Simplify Hazardous Materials Monitoring
3/6/2014
Companies that need to constantly monitor flows of highly abrasive or dangerous materials, including those in the power, pulp and paper, mining, oil and dredging industries, can now reduce maintenance costs, simplify regulatory compliance and increase safety using two new gamma ray gauges
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Agilent Technologies' Infiniium 9000 Series Oscilloscope Wins EDN China Innovation Award For Best Test And Measurement Product
12/7/2009
Agilent Technologies Inc. recently announced its Infiniium 9000 Series Oscilloscopes family has won the 2009 EDN China Innovation Award for the Best Test and Measurement Product
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Metryx Receives Two IC Industry Awards From EuroAsia Semiconductor
11/12/2008
Metryx, Limited, a supplier of mass metrology equipment to the semiconductor manufacturing industry, today announced that it has been recognized twice by EuroAsia Semiconductor at the 2008 IC Industry Awards, presented at this year’s SEMICON Europa
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Semilab Licenses Implant And Metal Thickness Metrology Technology From Applied Materials
9/17/2008
Semilab Co. Ltd., announced today that it has licensed key patents and transferred relevant know-how from Applied Materials, Inc. The acquired intellectual property (IP) covers technology and systems used in semiconductor applications for measuring implant and metal thickness
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Topcon Acquires Voxis, Inc., Scanner Technology Leader
9/10/2008
Topcon Corporation of Tokyo has announced the acquisition of Voxis, Inc., a United States-based company acknowledged as a global leader in laser scanner technology and high resolution motion systems
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Agilent Technologies' New Thermocouple Power Sensors Offer Widest Dynamic Range For Average Power Measurements
9/2/2008
Agilent Technologies Inc. today introduced new thermocouple power sensors that offer industry-leading dynamic range in average-power measurements
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SEMATECH To Host 3D IC Workshop On Manufacturing And Reliability September 25-26
8/18/2008
SEMATECH will host global experts representing a broad spectrum of the semiconductor industry at a workshop designed to explore manufacturing and reliability challenges for three-dimensional integrated circuit (3D IC) products