Business Wire

  1. Medical Manufacturing Technologies (MMT) Unveils The Glebar P5K Gauging System: Revolutionizing Guidewire Measurement And Metrology Processes With Unmatched Speed And Accuracy 9/9/2025

    Medical Manufacturing Technologies (MMT), a leading global provider of medical device manufacturing services and solutions, proudly announces the launch of the ground-breaking, patented Glebar P5K Gauging System.

  2. Onto Innovation Launches Next Generation OCD Metrology Platform To Enable Process Control For Advanced AI Devices 9/9/2025

    Onto Innovation Inc. today introduced the Atlas G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes.

  3. Mitutoyo Introduces Sensible Measurement For Everyone With The New Bold Compact QM-Fit Measurement System 9/4/2025

    Mitutoyo America Corporation, the world leader in metrology instruments, introduces the QM-Fit Smart Vision System. The QM-Fit represents a BOLD step forward in optical metrology.

  4. GaN-Based e-Beam Inspection And Metrology Co-Developed By Startup Photo Electron Soul Inc. And Nagoya University Will Be Evaluated By Kioxia, A Leading Flash Memory Producer 9/1/2025

    It was announced today that GaN (Gallium Nitride)-based e-Beam inspection and metrology for advanced semiconductor manufacturing, jointly developed by Nagoya University startup Photo electron Soul Inc. (PeS; CEO: Takayuki Suzuki) and the Nagoya University Amano-Honda Laboratory, will be evaluated by Kioxia Iwate Corporation (President and CEO: Koichiro Shibayama) in late September.

  5. Quartz Imaging Launches PCI-AM Version 9 Featuring Groundbreaking Template Matching For Automated Semiconductor Metrology 8/6/2025

    Quartz Imaging Corporation, a global leader in microscopy and metrology software, is proud to announce the release of PCI-AM Version 9, the latest and most advanced edition of its powerful automated measurement solution.

  6. Rigaku Launches XTRAIA XD-3300 Mass Production For Semiconductor Market 7/29/2025

    Rigaku Corporation, a global solution partner in X-ray metrology systems and a Group company of Rigaku Holdings Corporation (headquarters: Akishima, Tokyo; CEO: Jun Kawakami; hereinafter “Rigaku”), has launched full-fledged commercial production of XTRAIA XD-3300, a high-resolution microspot X-ray diffraction system.

  7. Mitutoyo America Corporation Releases MCOSMOS V5.4 Advanced Metrology Software Suite For Coordinate Measuring Machines To Improve Measurement Efficiency 7/23/2025

    Mitutoyo America Corporation, the leader in metrology instruments, solutions and support, announces the release of MCOSMOS V5.4, the latest version of advanced metrology software suite for coordinate measuring machines (CMMs).

  8. GelSight Launches Modulus: Precision Inspection For Previously Inaccessible Places 7/15/2025

    GelSight, a pioneer in tactile intelligence technology, today introduced the new GelSight Modulus system to further expand the boundaries of tactile sensing and usher in the next generation of mobile, micron-scale measurement.

  9. Mitutoyo Increases Inspection Accuracy And Range With The Launch Of New SurfaceMeasure-S Series SM0303S And 2929S In-Line Laser Sensors 6/24/2025

    Mitutoyo America Corporation, the leading manufacturer of precision metrology instruments and solutions, announces the release of the SurfaceMeasure-S Series. The SM0303S and 2929S sensors join the SM1008S sensor to complete the innovative collection of line-laser sensors engineered for in-line inspection.

  10. Bruker Experiences Growth In Semiconductor Advanced Packaging Market Fueled By AI Demands 6/24/2025

    Bruker Corporation today announced the shipment and installation of the 15th InSight WLI 3D optical metrology system to a leading semiconductor manufacturer.