Business Wire

1. Advanced Energy Introduces 401M Mid-Infrared Pyrometer For Precise Semiconductor Process Control 10/7/2025

   Advanced Energy Industries, Inc. (Nasdaq: AEIS), a global leader in highly engineered, precision power conversion, measurement and control solutions, announces the launch of the 401M mid-infrared optical pyrometer, designed for high-precision, non-contact temperature measurement in semiconductor and industrial process environments.

2. Aeva Unveils Eve 1V High-Precision, Non-Contact Motion Sensor For Next-Generation Manufacturing Automation 9/10/2025

   Aeva, a leader in next-generation sensing and perception systems, today announced the introduction of Aeva Eve 1V, a high-precision, non-contact motion sensor with the potential to redefine industrial speed, length, and position measurement wherever traditional encoders and tactile sensors are used in manufacturing today.

3. Medical Manufacturing Technologies (MMT) Unveils The Glebar P5K Gauging System: Revolutionizing Guidewire Measurement And Metrology Processes With Unmatched Speed And Accuracy 9/9/2025

   Medical Manufacturing Technologies (MMT), a leading global provider of medical device manufacturing services and solutions, proudly announces the launch of the ground-breaking, patented Glebar P5K Gauging System.

4. Onto Innovation Launches Next Generation OCD Metrology Platform To Enable Process Control For Advanced AI Devices 9/9/2025

   Onto Innovation Inc. today introduced the Atlas G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes.

5. Mitutoyo Introduces Sensible Measurement For Everyone With The New Bold Compact QM-Fit Measurement System 9/4/2025

   Mitutoyo America Corporation, the world leader in metrology instruments, introduces the QM-Fit Smart Vision System. The QM-Fit represents a BOLD step forward in optical metrology.

6. GaN-Based e-Beam Inspection And Metrology Co-Developed By Startup Photo Electron Soul Inc. And Nagoya University Will Be Evaluated By Kioxia, A Leading Flash Memory Producer 9/1/2025

   It was announced today that GaN (Gallium Nitride)-based e-Beam inspection and metrology for advanced semiconductor manufacturing, jointly developed by Nagoya University startup Photo electron Soul Inc. (PeS; CEO: Takayuki Suzuki) and the Nagoya University Amano-Honda Laboratory, will be evaluated by Kioxia Iwate Corporation (President and CEO: Koichiro Shibayama) in late September.

7. Quartz Imaging Launches PCI-AM Version 9 Featuring Groundbreaking Template Matching For Automated Semiconductor Metrology 8/6/2025

   Quartz Imaging Corporation, a global leader in microscopy and metrology software, is proud to announce the release of PCI-AM Version 9, the latest and most advanced edition of its powerful automated measurement solution.

8. Rigaku Launches XTRAIA XD-3300 Mass Production For Semiconductor Market 7/29/2025

   Rigaku Corporation, a global solution partner in X-ray metrology systems and a Group company of Rigaku Holdings Corporation (headquarters: Akishima, Tokyo; CEO: Jun Kawakami; hereinafter “Rigaku”), has launched full-fledged commercial production of XTRAIA XD-3300, a high-resolution microspot X-ray diffraction system.

9. Mitutoyo America Corporation Releases MCOSMOS V5.4 Advanced Metrology Software Suite For Coordinate Measuring Machines To Improve Measurement Efficiency 7/23/2025

   Mitutoyo America Corporation, the leader in metrology instruments, solutions and support, announces the release of MCOSMOS V5.4, the latest version of advanced metrology software suite for coordinate measuring machines (CMMs).

10. New Level And Density Gauges Simplify Hazardous Materials Monitoring 3/6/2014

    Companies that need to constantly monitor flows of highly abrasive or dangerous materials, including those in the power, pulp and paper, mining, oil and dredging industries, can now reduce maintenance costs, simplify regulatory compliance and increase safety using two new gamma ray gauges