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Semilab Licenses Implant And Metal Thickness Metrology Technology From Applied Materials
9/17/2008
Semilab Co. Ltd., announced today that it has licensed key patents and transferred relevant know-how from Applied Materials, Inc. The acquired intellectual property (IP) covers technology and systems used in semiconductor applications for measuring implant and metal thickness
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Topcon Acquires Voxis, Inc., Scanner Technology Leader
9/10/2008
Topcon Corporation of Tokyo has announced the acquisition of Voxis, Inc., a United States-based company acknowledged as a global leader in laser scanner technology and high resolution motion systems
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Agilent Technologies' New Thermocouple Power Sensors Offer Widest Dynamic Range For Average Power Measurements
9/2/2008
Agilent Technologies Inc. today introduced new thermocouple power sensors that offer industry-leading dynamic range in average-power measurements
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SEMATECH To Host 3D IC Workshop On Manufacturing And Reliability September 25-26
8/18/2008
SEMATECH will host global experts representing a broad spectrum of the semiconductor industry at a workshop designed to explore manufacturing and reliability challenges for three-dimensional integrated circuit (3D IC) products
