Latest Headlines

  1. Mitutoyo America Corporation Introduces HR-530 Series Hardness Tester
    2/8/2018

    Mitutoyo America Corporation is pleased to announce the release of the latest Rockwell Hardness Testers in its HR-530 Series, including the HR-530 (maximum specimen size height: 250 mm; depth: 150 mm) and the HR-530L (maximum specimen size height: 395 mm; depth 150 mm)

  2. ASF Metrology Intends To Acquire The CMM Business From Nikon Metrology
    2/8/2018

    Nikon Metrology announced recently that ASF Metrology intends to acquire Nikon Metrology’s coordinate measuring machines (CMM) business. The closing of the transaction is expected to take place in about 2 months.

  3. Nanometrics Selected For Fab-Wide Process Control Metrology By Domestic China 3D-NAND Manufacturer
    2/6/2018

    Nanometrics Incorporated (NASDAQ:NANO), a leading provider of advanced process control solutions, today announced that a domestic China 3D-NAND manufacturer has selected Nanometrics for fab-wide process control. Nanometrics’ suite of substrate, thin film and critical dimension metrology solutions, including QS3300 FTIR, Atlas® II+, IMPULSE®+ and NanoDiffract® software, will be deployed for critical 3D-NAND device measurement and control

  4. New FARO® Design ScanArm® 2.0 Improves Product Design Workflow
    2/6/2018

    FARO® (NASDAQ: FARO), the world's most trusted source for 3D measurement and imaging solutions for factory metrology, product design, construction BIM/CIM, public safety-forensics and 3D machine vision applications, introduces the next generation FARO® Design ScanArm® 2.0, http://www.faro.com/products/product-design/faro-design-scanarm/ specifically designed to address the most demanding challenges and requirements faced by product design and product engineering professionals

  5. Nanoscience Instruments Expands Its Portfolio With KLA-Tencor
    2/2/2018

    Nanoscience Instruments is proud to partner with KLA-Tencor to offer the MicroXAM-800 optical profiler a white light interferometer. For more than 15 years, Nanoscience Instruments has provided advanced instrumentation and applications consulting for microscopy and surface analysis techniques

  6. ShapeGrabber Releases Version 10 Of Its 3D Scanning Software
    2/1/2018

    ShapeGrabber today announced the release of its SGCentral Version 10 software. The software has a wide range of features, APIs, and tools that power ShapeGrabber's automated 3D scannersand allow users to rapidly set up, scan, and measure complex-shaped parts in minutes.

  7. 3D At Depth Completes 300 Offshore LiDAR Metrologies
    1/30/2018

    3D at Depth Inc., a global provider of advanced subsea LiDAR (SL) systems and survey support services, announced today the company has completed its 300th subsea LiDAR spool metrology. The subsea LiDAR measurement, conducted offshore within the Mediterranean Sea, covered 8 long spool metrologies with lengths greater than 90m and was completed in 24 hours

  8. Rigaku To Feature Latest Analytical Instrumentation At Pittcon 2018
    1/27/2018

    ), held Monday, February 26, 2018 through Thursday, March 1, 2018 at the Orange County Convention Center in Orlando, FL USA

  9. Nanoscience Instruments Expands Its Portfolio With Technoorg Linda Ion Milling Tools
    1/26/2018

    Nanoscience Instruments is proud to partner with Technoorg Linda, expanding their world-class line of sample preparation tools used for transmission and scanning electron microscopy into the United States and Canada. For more than 15 years, Nanoscience Instruments has provided advanced instruments and applications consulting for microscopy and surface analysis. This partnership strengthens the scope of products for researchers in academia and industry

  10. Nova's Metrology Solution Selected By Two Leading Memory IC Manufacturers
    1/16/2018

    Nova (NASDAQ: NVMI), a leading innovator and a key provider of metrology solutions for advanced process control used in semiconductor manufacturing, today announced that two leading memory IC manufacturers recently selected Nova's most advanced integrated metrology solution for their new DRAM and 3D-NAND production lines