Business Wire

  1. Quartz Imaging Launches PCI-AM Version 9 Featuring Groundbreaking Template Matching For Automated Semiconductor Metrology 8/6/2025

    Quartz Imaging Corporation, a global leader in microscopy and metrology software, is proud to announce the release of PCI-AM Version 9, the latest and most advanced edition of its powerful automated measurement solution.

  2. Rigaku Launches XTRAIA XD-3300 Mass Production For Semiconductor Market 7/29/2025

    Rigaku Corporation, a global solution partner in X-ray metrology systems and a Group company of Rigaku Holdings Corporation (headquarters: Akishima, Tokyo; CEO: Jun Kawakami; hereinafter “Rigaku”), has launched full-fledged commercial production of XTRAIA XD-3300, a high-resolution microspot X-ray diffraction system.

  3. Mitutoyo America Corporation Releases MCOSMOS V5.4 Advanced Metrology Software Suite For Coordinate Measuring Machines To Improve Measurement Efficiency 7/23/2025

    Mitutoyo America Corporation, the leader in metrology instruments, solutions and support, announces the release of MCOSMOS V5.4, the latest version of advanced metrology software suite for coordinate measuring machines (CMMs).

  4. GelSight Launches Modulus: Precision Inspection For Previously Inaccessible Places 7/15/2025

    GelSight, a pioneer in tactile intelligence technology, today introduced the new GelSight Modulus system to further expand the boundaries of tactile sensing and usher in the next generation of mobile, micron-scale measurement.

  5. Mitutoyo Increases Inspection Accuracy And Range With The Launch Of New SurfaceMeasure-S Series SM0303S And 2929S In-Line Laser Sensors 6/24/2025

    Mitutoyo America Corporation, the leading manufacturer of precision metrology instruments and solutions, announces the release of the SurfaceMeasure-S Series. The SM0303S and 2929S sensors join the SM1008S sensor to complete the innovative collection of line-laser sensors engineered for in-line inspection.

  6. Bruker Experiences Growth In Semiconductor Advanced Packaging Market Fueled By AI Demands 6/24/2025

    Bruker Corporation today announced the shipment and installation of the 15th InSight WLI 3D optical metrology system to a leading semiconductor manufacturer.

  7. New Level And Density Gauges Simplify Hazardous Materials Monitoring 3/6/2014

    Companies that need to constantly monitor flows of highly abrasive or dangerous materials, including those in the power, pulp and paper, mining, oil and dredging industries, can now reduce maintenance costs, simplify regulatory compliance and increase safety using two new gamma ray gauges

  8. Agilent Technologies' Infiniium 9000 Series Oscilloscope Wins EDN China Innovation Award For Best Test And Measurement Product 12/7/2009
    Agilent Technologies Inc. recently announced its Infiniium 9000 Series Oscilloscopes family has won the 2009 EDN China Innovation Award for the Best Test and Measurement Product
  9. Metryx Receives Two IC Industry Awards From EuroAsia Semiconductor 11/12/2008
    Metryx, Limited, a supplier of mass metrology equipment to the semiconductor manufacturing industry, today announced that it has been recognized twice by EuroAsia Semiconductor at the 2008 IC Industry Awards, presented at this year’s SEMICON Europa
  10. Semilab Licenses Implant And Metal Thickness Metrology Technology From Applied Materials 9/17/2008
    Semilab Co. Ltd., announced today that it has licensed key patents and transferred relevant know-how from Applied Materials, Inc. The acquired intellectual property (IP) covers technology and systems used in semiconductor applications for measuring implant and metal thickness