Fluke Process Instruments Introduces New Pyrometer For High-Temperature Applications And Additional Fieldbus Options
Fluke Process Instruments, a global leader in infrared temperature measurement and profiling solutions for industrial applications, has extended its series of Thermalert 4.0 spot pyrometers to include new shortwave sensors as well as additional interface options. This press release features multimedia.
Saki Corporation’s Compact, Lightweight, Inline 3D-CT Automated X-ray Inspection System For PCBAs Delivers Increased Speed, Accuracy, And Safety
Saki Corporation, an innovator in the field of automated optical and X-ray inspection and measurement equipment, introduces a compact, lightweight, inline 3D-CT automated X-ray inspection machine, the 3Xi-M110, for inspection of printed circuit board assemblies (PCBAs).
Mitutoyo America Corporation Introduces MiSCAN Vision System
Mitutoyo America Corporation is pleased to announce the release of the MiSCAN Vision System. MiSCAN is a multiple sensor microscopic-form measurement system using combined coordinate measuring machine (CMM) and vision measurement system technology and features a micro-form scanning probe.
C3 Metrics Receives MRC Accreditation For Display Ad Viewability Measurement
C3 Metrics recently announced that the Media Rating Council (MRC) has granted it accreditation for measurement of Desktop and Mobile Web Display Ad Viewable Impressions and related viewability metrics.
Mitutoyo America Corporation Introduces New QS-L Vision Series
Mitutoyo America Corporation is pleased to announce the release of the QS-L Vision Series to its Vision Measuring System Line.
New Level And Density Gauges Simplify Hazardous Materials Monitoring
Companies that need to constantly monitor flows of highly abrasive or dangerous materials, including those in the power, pulp and paper, mining, oil and dredging industries, can now reduce maintenance costs, simplify regulatory compliance and increase safety using two new gamma ray gauges
Agilent Technologies’ Infiniium 9000 Series Oscilloscope Wins EDN China Innovation Award For Best Test And Measurement Product
Agilent Technologies Inc. recently announced its Infiniium 9000 Series Oscilloscopes family has won the 2009 EDN China Innovation Award for the Best Test and Measurement Product
Metryx Receives Two IC Industry Awards From EuroAsia Semiconductor
Metryx, Limited, a supplier of mass metrology equipment to the semiconductor manufacturing industry, today announced that it has been recognized twice by EuroAsia Semiconductor at the 2008 IC Industry Awards, presented at this year’s SEMICON Europa
Semilab Licenses Implant And Metal Thickness Metrology Technology From Applied Materials
Semilab Co. Ltd., announced today that it has licensed key patents and transferred relevant know-how from Applied Materials, Inc. The acquired intellectual property (IP) covers technology and systems used in semiconductor applications for measuring implant and metal thickness
Topcon Acquires Voxis, Inc., Scanner Technology Leader
Topcon Corporation of Tokyo has announced the acquisition of Voxis, Inc., a United States-based company acknowledged as a global leader in laser scanner technology and high resolution motion systems