X-Ray Coating Thickness Measurement Device

The new Fischerscope X-ray XDVM-W is designed to measure the coating thickness and alloy composition of almost any metal coating system including single, binary, and ternary alloy coatings; double coatings; double coatings with one alloy layer; and triple coatings.

The device is considered well suited for high volume coating thickness and measurements on screws, connector contact, contact strips, and PC boards. The system measures according to test method ASTM B568 or DIN 50987 and ISO 3497.

Features of the measuring device include a solid sheet metal housing for the measuring chamber and access to the large slotted measuring chamber (560- × 530- × 160-mm/ 22- × 20.8- × 6.3-in.) that is can be used for both small and large specimens. The tool also features high-precision, programmable XY measuring stages with travel distances of 175- × 175-mm (6.9- × 6.9-in.) and 250- × 250-mm (9.8- × 9.8-in.). The measuring head is programmable in the Z-axis, with a travel distance of 145-mm (5.7-in.).

Users can choose between two collimator assemblies, each with four apertures. A high-resolution video camera that includes switchable magnification and inserted cross hair true-to-scale test spot display performs sample positioning.

The device also includes a micro-focus, high-performance X-ray tube, Ni and Be primary filters, Xenon filled proportional counter tube with internal 4096 channel ADC spectrum processing with compression to 256 channels for external display, and four focal planes.

In addition, the device features the manufacturer's new WinFTM software that runs on Windows 95, 98, and NT operating systems.

Fischer Technology, Inc., 750 Marshall Phelps Road, Windsor, CT 06095. Tel: 860-683-0781. Fax: 860-688-8496.