News | May 24, 2004

Ocean Optics Launches Metrology Line

Dunedin, FL -- Ocean Optics, Inc., a supplier of optical-sensing systems and accessories, has introduced a line of high-precision metrology tools for thin film measurement, plasma analysis, and optics characterization. The company, which pioneered the development of miniature fiber optic spectrometers, will now provide fully integrated metrology systems complemented by sophisticated software and applications database support.

Among the turnkey metrology systems Ocean Optics now offers are PlasCalc, an optical emission spectrometer and control system for monitoring and controlling plasma processes; SpecEl, an ellipsometry tool for analyzing the thickness of optical layers from 10 nm to 250 microns; and the LTP Long Trace Profilometer, an interferometric optical profiling instrument for absolute figure measurement of optical components up to 1500 mm in diameter.

Ocean Analytics, a division of Ocean Optics recently created to serve customers of the company's most sophisticated application-specific, turnkey systems, will support the metrology product line with customer visits, on-site demonstrations and seminars.

Each of the new metrology products incorporates Ocean Optics' miniature fiber optic spectroscopy technology. The combination of this CCD-array technology, optically innovative engineering and powerful software yields turnkey metrology systems for high-precision optical and thin film analysis.

Source: Ocean Optics