GE Sensing & Inspection Technologies Introduces The v|tome|x L 300
Wunstorf, Germany - GE Sensing & Inspection Technologies is adding the v|tome|x L 300 to its phoenix|x-ray range. This is the first computed tomography (CT) system which can achieve a resolution of 1µm with a 300kV X-ray tube while offering even higher contrast resolution through a new temperature-stabilised GE digital detector. The new CT system is equally suited to 2D and 3D analysis as well as to the precise dimensional measurement of components, which, owing to their complex structure, cannot be inspected in a non-destructive manner using optical or tactile coordinate measuring machines. As such, it will find particular application in the automotive and aerospace sectors, as well as the engineering sector in general..
The newly developed 300 kV / 500 watt microfocus X-ray tube of the v|tome|x L 300 is suitable for high magnification applications as well as scans of strongly absorbing samples and is ideal for quality monitoring. For example, it can capture cast parts weighing up to 50 kg in three dimensions at high resolutions and create virtual cross-sections of the part's interior from any angle. The system also has a special metrology package that contains everything needed for dimensional measuring with the greatest possible precision and user-friendliness, from calibration instruments to surface extraction modules. In addition to 2D wall thickness measurements, the CT volume data can be quickly and easily compared with CAD data, for example, in order to analyse the complete component to ensure it complies with all specified dimensions ¬ .
Whereas the bipolar construction and comparatively large focal spot of conventional 300 kV X-ray tubes do not permit high geometric magnification, the new phoenix|x-ray X-ray tube is unipolar, with a focal spot only 4.5 mm from the X-ray beam. As cone-beam tomography only allows particularly high magnifications with a very short focal point to object distance, the unipolar 300 kV tube definitely has the advantage. The v|tome|x L 300 also has a measuring range extension for samples up to 500 mm diameter. To further improve the quality of the scan, the system can be equipped with a multiline detector. To avoid installing an exchangeable head, the v|tome|x L 300 can also be fitted with an additional 180 kV high-power nanofocus X-ray tube for particularly high resolution scans. The tubes can simply be changed at the press of a button.
The user-friendly and highly efficient phoenix|x-ray CT software datos|x includes a wide variety of modules for optimising CT results for superior precision and quality. The new bhc+|module, for example, includes fully automated beam hardening correction. This compensates for undesirable artifacts and generates a significant increase in the level of precision for pore analyses or surface extraction for subsequent dimensional measurements. As a result of recent hardware and software developments, it is now possible to obtain effective CT results using the v|tome|x L 300 in a very short time.
SOURCE: GE Sensing & Inspection Technologies