News | May 11, 2010

Cactus Metrology To Represent SiGlaz In U.S.

Santa Clara, CA - SiGlaz announced recently that the company has signed an exclusive agreement with Cactus Metrology, LLC of Phoenix, Arizona to provide sales, applications and service for SiGlaz Defect Navigator (SDN) software in the United States. SiGlaz Defect Navigator is a fully functional defect and yield analysis software package designed to store and analyze defect inspection files for low and medium volume semiconductor operations.

According to John Poreda, SiGlaz Vice President of Sales and Marketing, "There is an excellent opportunity for SiGlaz to provide data management and analysis capability to customers with a limited number of wafer inspection tools, and we are very pleased to have Cactus representing and supporting our products with these customers. Cactus has demonstrated that they are well-positioned in this segment of the wafer inspection and metrology market and they have a good understanding of these customers' data analysis needs. We look forward to a long and successful relationship with them."

Cactus Metrology President, Steve Whitton, agrees that SiGlaz's data management and analysis products will be well received in the market. "Many semiconductor operations do not have the production volumes to justify the larger, more expensive data analysis software currently offered in the market. For a number of years, many of these companies have been looking for a cost effective solution to analyzing their inspection and metrology data. SiGlaz has demonstrated impressive capability to adapt their product to meet the needs of this market. Many of the customers with whom we have spoken were very enthusiastic about integrating SDN software into their operations."

Cactus Metrology is a privately held company focusing on metrology solutions providing sales consulting, applications and tool maintenance support services to the semiconductor, solar and MEMs markets. The company specializes in pattern and unpattern defect inspection, review and surface metrology equipment, as well as yield analysis software.

SOURCE: SiGlaz