Current Headlines

1. Sony Semiconductor Solutions To Release X-Ray CMOS Sensor With Industry's Fastest^(*1) Imaging And Low-Noise Performance For Inspection And Measurement Instrumentation 6/8/2026

   Sony Semiconductor Solutions Corporation (Sony) today announced the upcoming release, mass-production, and shipment of the IMX711 direct conversion charge-integrating X-ray CMOS image sensor.

2. Hexagon Manufacturing Intelligence Launches PC-DMIS FUSION, Modernizing Metrology Reporting And Analytics 6/6/2026

   Hexagon Manufacturing Intelligence’s Stationary Metrology Division today announced the launch of PC-DMIS FUSION. It provides PC-DMIS users with real-time information, visualisation, insights, and SPC analysis to enable increased productivity based on data-driven decision making.

3. Second Global ISO Standard Expands LumaCyte Measurement Framework To Mammalian Cell Viability 6/2/2026

   A newly released International Organization for Standardization (ISO) global standard for mammalian cell viability brings greater consistency to how cellular state is assessed across biologics and cell therapy.

4. SICK Integrates Aeva's High-Precision Technology Into Industrial Sensing Product Line 6/2/2026

   Aeva, a leader in next-generation sensing and perception systems, today announced that SICK, a leading provider of sensor-based automation solutions, is expanding its industrial sensing product portfolio with new Frequency Modulated Continuous Wave (FMCW)-based technology powered by Aeva.

5. Invisix Raises €20M Seed Round To Bring Soft X-Ray Metrology To AI-Era Chip Manufacturing 6/1/2026

   Invisix, the semiconductor metrology company developing next-generation measurement tools for advanced chip manufacturing, has raised an oversubscribed €20 million seed round, which includes Hitachi Ventures, Transition Ventures, imec.xpand, Doosan Investment Co., and a tier-1 semiconductor manufacturer.

6. Park Systems Launches Park FX40 IR, Uniting Full AFM Performance And Nanoscale IR Spectroscopy In A Single Automated Platform 5/29/2026

   Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, today announced the commercial launch of the Park FX40 IR, completing the company's Nano-IR spectrometer portfolio with a small-sample platform.

7. Nikon Launches ECLIPSE LV100AMS, A New One-Click Automated Microscope 5/27/2026

   Nikon Corporation (Nikon) has launched the ECLIPSE LV100AMS, a new one‑click automated microscope designed to simplify industrial inspection and quality control.

8. Reach Deeper, Measure Smarter: SCANOLOGY Launches AccuArm Portable CMM 5/25/2026

   As manufacturing becomes more complex, quality teams require measurement tools that combine precision, portability, and real production readiness. To address this need, SCANOLOGY introduces the AccuArm Portable Coordinate Measuring Machine (PCMM), a high-precision articulated arm designed for flexible inspection across shop floors, assembly lines, and metrology labs.

9. GelSight Expands Modulus Platform With High Resolution Lenses: Lab-Grade Roughness Measurement, One Lens Swap Away 5/20/2026

   GelSight, a pioneer in surface analysis technology, today announced the launch of the High Resolution (HR) family of GelSight Modulus lenses, consisting of two new 20mm optical lenses, the L2000HR (straight) and L2090HR (90-degree), designed to work with existing Modulus camera bodies.

10. SHINING3D Inspect 2026 Enhances 3D Inspection With More Streamlined And Modular Workflows 5/20/2026

    As manufacturing and quality control workflows continue to evolve, industries are placing higher demands on efficiency, flexibility, and inspection accuracy. To support these growing needs, SHINING 3D Metrology introduces SHINING3D Inspect 2026 — a streamlined, modular 3D inspection software.