• Heliotis M3 And M3-XL 3D Optical Profilers Integrate MountainsMap Imaging Topography Software
• Konica Minolta Sensing Launches New CL-500A Illuminance Spectrophotometer
• Capture 3D's New ATOS Compact Scan - New Breed Of 3D Scanner For Fast And Accurate 3D Measurements
• IET Labs Purchases The 1900 Series And 7600 Plus Precision LCR Meter Lines From QuadTech Inc.
• Knight Optical Invests In Trioptics Optispheric Instrument

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• Agilent Technologies Establishes Capacitance Calibration Standard For AFM-Based Scanning Microwave Microscopy
• Labsphere Delivers Fourth Life Test Station To Major LED Manufacturer
• Control Microsystems Partners With AutoSol to Expand ClearSCADA 2007 Edition, Next Generation SCADA Management Software
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• Wrap It Up! How The OMNi-4000 Automatic Wrapper Helped Little Giant Farmers Market Save Time And Labor Costs

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• Nanometrics Announces Advanced Metrology Milestone
• The L.S. Starrett Company Acquires Bytewise, A Non-Contact, Profile Measurement Systems Manufacturer To Extend Its Reach In The Test And Measurement Market
• Nanometrics Acquires Nanda Technologies
• Rudolph Receives First Orders For 450 mm Defect Inspection And Thin Film Metrology Systems
• Rudolph Fulfills Multiple System Orders For TSV Inspection And Metrology
• Bruker Announces Agreement To Acquire CETR

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