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Agilent Technologies’ New Thermocouple Power Sensors Offer Widest Dynamic Range For Average Power Measurements
Agilent Technologies Inc. today introduced new thermocouple power sensors that offer industry-leading dynamic range in average-power measurements.

Engineers Conduct Comparative Analysis Of Equipment With Software For Wireless Accelerometer
Software engineers at a maker of wireless metrology devices for wafer processing equipment, CyberOptics Semiconductor, Inc. (CSI), have recently developed companion applications that allow fab engineers to evaluate equipment acceleration and vibration via comparative analysis of log file data and real-time frequency and spec-limit readings in conjunction with the company's wafer-like accelerometer -- the WaferSense Auto Vibration System (AVS), according to Dennis J. Bonciolini, the company's CTO.

Stop The Waste: Making Measurements Measure Up To Standards
Researchers at the National Institute of Standards and Technology (NIST) are working to enable “WiFi-quality” information standards for manufacturing metrology systems. In this pursuit, NIST researchers and their industry partners have developed DMIS (Dimensional Measurement Interface Standard), which is a language for performing dimensional measurements.

'Racetrack' For Fast Electrons In Semiconductor Structures
In order to realize the electrical units of voltage, resistance and current with highest accuracy quantum effects in nano-circuits are nowadays used. Important prerequisites are extremely pure semiconductor layers where high-mobile electrons move through the crystal without collision with residual impurities.

Metris LC60D Laser Scanner Revolutionizes Digital Inspection
Metris launches LC60D, a next-generation digital 3D line scanner. Equipped with state-of-the-art digital technology and powerful on-board data processing, the LC60D scanner more than triples today’s common scan rates.

High-Pressure And Seawater Resistant LVDT Position Sensors For Deep Submerge Applications
Macro Sensors specializes in the manufacture of LVDT-based linear position sensors, custom designs High-Pressure and Seawater Resistant LVDT Position Sensors for incorporation into sub-sea measurement systems used to monitor structural movement for long-term Finite Element Analysis of offshore platforms, pipelines, derricks, moorings and other critical high-stress members on offshore oil platforms.

Bruker AXS Announces Closing Of S.I.S. Acquisition And Exhibits Its New Atomic Force Microscopy (AFM) Product Line At EMC 2008
Bruker AXS GmbH announces the closing of its acquisition of S.I.S. Surface Imaging Systems GmbH, located near Aachen, Germany.

Topcon Acquires Voxis, Inc., Scanner Technology Leader
Topcon Corporation of Tokyo has announced the acquisition of Voxis, Inc., a United States-based company acknowledged as a global leader in laser scanner technology and high resolution motion systems.

SEMATECH To Host 3D IC Workshop On Manufacturing And Reliability September 25-26
SEMATECH will host global experts representing a broad spectrum of the semiconductor industry at a workshop designed to explore manufacturing and reliability challenges for three-dimensional integrated circuit (3D IC) products.

Fluke Introduces A40B Precision Current Shunt Set For Directly Measuring Current In The Laboratory
Fluke Corporation has introduced the Fluke A40B Precision Current Shunt Set, an array of precision devices designed to simplify the task of making precision current measurements in the laboratory.

Keithley Receives Industry Award For Semiconductor Measurement System
Keithley Instruments, Inc. (KEI - News), a leader in solutions for emerging measurement needs, announces that it has been awarded the prestigious Editor's Choice Best Product Award from Semiconductor International magazine for its Model 4200-CVU Semiconductor Measurement System, which is used to make fast and easy C-V (Capacitance-Voltage) measurements.

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