Measurement Probe
Source: Fischer Technology, Inc.
The ED10 dual measurement probe can be used with the firm's handheld Dualscopes or the benchtop Multi-Measurement System to automatically recognize a
The ED10 dual measurement probe can be used with the firm's handheld Dualscopes or the benchtop Multi-Measurement System to automatically recognize a substrate to be measured. Using either the magnetic induction or eddy current method of measurement, the probe lets you measure paint, plastic, and organic coatings on non-ferrous and ferrous materials. It also can measure non-ferrous metal plating such as chromium, copper, and zinc as well as steel and cast iron.
The probe stores specific application data, which means that parameters are automatically loaded and can be printed out. Using the bi-directional RS232 interface, the data also can be sent to a PC, where results can be printed out as histograms, probability charts, and Cp or Cpk indices.
Fischer Technology Inc., 750 Marshall Phelps Rd., Windsor, CT 06095. Tel: 860-683-0781; Fax: 860-688-8496.
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