News Articles http://www.metrologyworld.com/ Thu, 02 Feb 2012 07:20:00 GMT Mitutoyo America Corporation announces availability of its new, High-Accuracy Digimatic Digital Micrometer - the first micrometer to offer 0.1µm resolution measurement. Now, high-accuracy measurement can be had in a convenient, hand-held tool http://www.metrologyworld.com/article.mvc/Mitutoyo-Introduces-Worlds-First-01-0001?atc~c=771+s=773+r=001+l=a Thu, 02 Feb 2012 07:20:00 GMT IET Labs, is a leading provider of Decade Resistor, Inductance and Capacitor Standards, Megohmmeters, Stroboscopes and Digibridge LCR Meters, announces that it has purchased the 1910, 1920 and 7600 Plus Precision LCR Meter Products from QuadTech Inc http://www.metrologyworld.com/article.mvc/IET-Labs-Purchases-The-1900-Series-And-7600-0001?atc~c=771+s=773+r=001+l=a Thu, 26 Jan 2012 09:59:00 GMT Knight Optical (UK) Ltd. continues its investment in its Metrology laboratory with the installation of a Trioptics Optispheric with a Wavesensor Reflex attachment http://www.metrologyworld.com/article.mvc/Knight-Optical-Invests-In-Trioptics-0002?atc~c=771+s=773+r=001+l=a Thu, 26 Jan 2012 09:38:00 GMT Konica Minolta Sensing Americas, Inc. (KMSA), the worldwide leader in the industrial measurement of color, light and 3D shape, announces the launch of its newest light measurement product, the CL-500A Illuminance Spectrophotometer http://www.metrologyworld.com/article.mvc/Konica-Minolta-Sensing-Launches-New-CL-500A-0002?atc~c=771+s=773+r=001+l=a Mon, 23 Jan 2012 10:53:00 GMT Minus K Technology, a leading manufacturer of vibration isolation products has partnered with Kinetic Systems, Inc. in designing a new, versatile, ultra-low natural frequency optical table isolation system. http://www.metrologyworld.com/article.mvc/New-MK52-Negative-Stiffness-Optical-Vibration-0001?atc~c=771+s=773+r=001+l=a Mon, 23 Jan 2012 05:21:00 GMT Capture 3D's GOM ATOS series of industrial optical 3D scanners provide accurate scans with detailed resolution at high speeds. ATOS delivers 3D measurement data and analysis for industrial components such as sheet metal parts, tools and dies, turbine blades, prototypes, injection molded parts, castings, and more http://www.metrologyworld.com/article.mvc/Capture-3Ds-New-ATOS-Compact-Scan-New-0001?atc~c=771+s=773+r=001+l=a Thu, 19 Jan 2012 10:28:00 GMT HEIDENHAIN announces the latest version of their PC-based QUADRA-CHEK Metrology software providing advanced functionality for inspection measurement machines http://www.metrologyworld.com/article.mvc/New-QUADRA-CHEK-Metrology-Software-Provides-0001?atc~c=771+s=773+r=001+l=a Thu, 12 Jan 2012 07:42:00 GMT Heliotis and Digital Surf announced that MountainsMap Imaging Topography surface metrology software based upon Digital Surf's Mountains Technology will be supplied with Heliotis M3 and M3-XL 3D Optical Profilers http://www.metrologyworld.com/article.mvc/Heliotis-M3-And-M3-XL-3D-Optical-Profilers-0001?atc~c=771+s=773+r=001+l=a Wed, 11 Jan 2012 11:09:00 GMT The National Institute of Standards and Technology (NIST), in collaboration with the Centers for Disease Control and Prevention (CDC), has developed two new Standard Reference Materials (SRMs) for measurements of human exposure to environmental toxins http://www.metrologyworld.com/article.mvc/NIST-Releases-Two-New-SRMs-For-Monitoring-0001?atc~c=771+s=773+r=001+l=a Wed, 11 Jan 2012 04:07:00 GMT Nova Measuring Instruments Ltd. provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, recently announced that a leading logic manufacturer recently selected Nova for its most advanced standalone metrology tool and software modeling platform http://www.metrologyworld.com/article.mvc/Novas-Metrology-Solutions-Are-Selected-By-A-0001?atc~c=771+s=773+r=001+l=a Tue, 10 Jan 2012 09:17:00 GMT Nanometrics Incorporated, a leading supplier of advanced process control systems and solutions, Recently announced a significant milestone marking the adoption of its optical critical dimension (OCD) technology http://www.metrologyworld.com/article.mvc/Nanometrics-Announces-Advanced-Metrology-0001?atc~c=771+s=773+r=001+l=a Mon, 09 Jan 2012 21:02:00 GMT Palmer Instruments, Inc., manufacturer of temperature and pressure instrumentation since 1836, announces the addition of Digital Pressure Gauges to its line of process pressure instrumentation http://www.metrologyworld.com/article.mvc/Palmer-Instruments-Inc-Announces-New-Line-0001?atc~c=771+s=773+r=001+l=a Fri, 06 Jan 2012 10:52:00 GMT Field System Machining (FSM) has added laser tracker portable on-site three dimensional (3D laser) portable imaging metrology to its arsenal of on-site industrial on-site portable machining and machinery repair weapons http://www.metrologyworld.com/article.mvc/3-D-Laser-Tracking-Metrology-Services-0001?atc~c=771+s=773+r=001+l=a Thu, 29 Dec 2011 08:40:00 GMT Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that a major foundry recently placed $10M orders for its integrated and standalone metrology tools http://www.metrologyworld.com/article.mvc/Nova-Receives-10M-Orders-From-A-Major-0001?atc~c=771+s=773+r=001+l=a Thu, 22 Dec 2011 12:27:00 GMT Gamma Scientific, NVLAP Lab Code 200823-0, has been awarded accreditation by the National Voluntary Laboratory Accreditation Program under the Energy Efficient Lighting Products Program http://www.metrologyworld.com/article.mvc/Gamma-Scientific-Laboratory-Receives-NVLAP-0001?atc~c=771+s=773+r=001+l=a Thu, 22 Dec 2011 09:30:00 GMT Reduce the time it takes to get up to speed and receive results. The Shimadzu UV/Visible Scanning Spectrophotometers feature large displays to quickly read graphical results as well as screen prompts to easily guide users http://www.metrologyworld.com/article.mvc/Compact-Shimadzu-UVVisible-Scanning-0001?atc~c=771+s=773+r=001+l=a Tue, 20 Dec 2011 12:21:00 GMT Alliance Scale, Inc. has introduced a line of Class F cast iron grip handle weights for use by installers, service technicians, and state and local officials to calibrate all types of commercial weighing equipment http://www.metrologyworld.com/article.mvc/Grip-Handle-Weights-From-Alliance-Scale-0001?atc~c=771+s=773+r=001+l=a Tue, 20 Dec 2011 06:52:00 GMT A measurement result without any information about the measurement uncertainty is useless!" states Dr. Neuschaefer-Rube, expert in the field of coordinate metrology from the German metrology institute PTB http://www.metrologyworld.com/article.mvc/Optical-3D-Measurement-Systems-From-Alicona-0001?atc~c=771+s=773+r=001+l=a Sun, 18 Dec 2011 12:16:00 GMT Stingray table-top digital X-ray inspection from Essemtec features ease of use and quick setup. The affordable device is ideal for measurement and inspection in electronics production, incoming goods departments or process laboratories http://www.metrologyworld.com/article.mvc/Affordable-Digital-X-ray-For-Every-Production-0001?atc~c=771+s=773+r=001+l=a Fri, 16 Dec 2011 10:37:00 GMT The Coordinate Metrology Society (CMS), the eminent membership association for measurement professionals, today announced their "Call for Papers" for the 2012 Coordinate Metrology Systems Conference (CMSC) http://www.metrologyworld.com/article.mvc/The-Coordinate-Metrology-Society-Announces-0001?atc~c=771+s=773+r=001+l=a Fri, 16 Dec 2011 07:14:00 GMT