Current Headlines

1. Park Systems Introduces Park NX20 Atomic Force Microscope, The Leading AFM Nano Metrology Tool For Device Failure Analysis
   5/10/2013

   Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX20, an enhanced design of the already successful XE series that assures the highest level of precision for roughness measurement and defect review

2. ABB Acquires Los Gatos Research, Adding Innovative Gas Analytical Measurement Solutions
   5/2/2013

   ABB, a global leader in electric power and automation, announced today that it has agreed to acquire Los Gatos Research (LGR) of Mountain View, California, to add a new line of high-performance gas analyzers to ABB's leading measurement business

3. Thermo Fisher Scientific Expands Optical Measurement Capability For Laboratory Water And Wastewater Analysis
   5/2/2013

   Thermo Fisher Scientific Inc., the world leader in serving science, has expanded its portfolio of optical measurement instruments with the introduction of the Thermo Scientific Orion AquaMate 7000 and 8000 Series spectrophotometers, enabling water and wastewater lab operators to select UV-Vis wavelengths quickly and easily for accurate concentration measurements

4. Quartz Imaging Introduces Automated Measurement For Semiconductor Images
   4/30/2013

   It can be very time consuming for engineers to measure the various features of an X-SEM image of a semiconductor device

5. Burns Engineering Releases Expanded Catalog For Temperature Measurement In Sanitary Applications
   4/30/2013

   The Series "S" Catalog From Burns Engineering Highlights RTD and Thermocouple Designs Used to Measure Temperature in Sanitary Processing Applications. Expanded Sections on Sanitary Thermowells, Non-Intrusive Sensors and Transmitters Provide Additional Insight for Increasing Temperature Measurement Confidence for Pharma, Biotech and Food and Beverage Processors

6. X-Rite Pantone Launches Ci4200 Compact Spectrophotometer To Help Companies Manage Color Accurately And Affordably
   4/30/2013

   X-Rite, Incorporated and its wholly owned subsidiary Pantone is launching its Ci4200 compact spectrophotometer as a precise and affordable solution for companies that want to establish or improve color control programs in industrial settings

7. Samsung Galaxy S4 Now Available For Testing On Keynote’s DeviceAnywhere Platform - Just As It Hits A Store Near You
   4/30/2013

   Keynote, the global leader in Internet and mobile cloud testing and monitoring, recently announced support for the Samsung Galaxy S4 on its DeviceAnywhere mobile testing platform

8. HIOKI Launches 3-Phase Digital Power Meters For The Development And Manufacture Of Electronic And Industrial Equipment
   4/29/2013

   HIOKI E.E. CORPORATION is pleased to announce the launch of two new digital 3-phase Power Meters Models PW3336 and PW3337

9. Rudolph Purchases Selected Assets From Tamar Technology; Adds 3D Measurement Capability For Advanced Packaging Applications
   4/29/2013

   Rudolph Technologies, Inc., a leading provider of process characterization, photolithography equipment and software for the semiconductor, FPD, LED and solar industries, announced recently that it has purchased selected assets, including a strong patent portfolio, relating to metrology capability from Tamar Technology, Newbury Park, Calif

10. GaGe Announces New Ultra High-Speed PCI Express Waveform Digitizer
    4/18/2013

    GaGe, a worldwide leader in the design and manufacture of high-performance digitizers and oscilloscope cards, recently announced the release of its new ultra high-speed PCI Express digitizers