Current Headlines

  1. NOVA Extends Its Optical CD Portfolio With New Metrology Solution For Advanced Technology Nodes
    7/14/2015

    Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and key provider of metrology solutions for advanced process control used in semiconductor manufacturing, announced today the launch of its new standalone Optical CD system, the HelioSense100TM, targeted at the most complex device manufacturing across the semiconductor segments

  2. Analog Devices Launches Industry’s First Quad-Channel Protector And Multiplexers With Programmable Fault Detection
    7/9/2015

    Analog Devices, Inc. recently introduced a quad-channel protector and two multiplexers offering +/-55-V overvoltage protection (OVP) for precision converters, amplifiers and other components that operate from a low voltage of 4.5 V up to 36 V

  3. New Solution Accelerates Development Of Automotive Positioning Systems And Vehicle-To-Vehicle Communications
    7/8/2015

    Spirent Communications recently launched its Automotive Record and Playback test system to help drive innovation and improvements in the rapidly evolving vehicle navigation and connected car ecosystem

  4. CyberOptics Introduces New WaferSense And ReticleSense Auto Multi Sensors (AMS)
    7/8/2015

    CyberOptics Corporation, a leading global developer and manufacturer of high precision 3D sensing technology solutions, announces the first wireless sensor to combine leveling, vibration and humidity measurement in an all-in-one multi sensor, available in both WaferSense or ReticleSense form factors

  5. Rudolph Receives JetStep Lithography System Order From Leading OSAT For Copper Pillar Bump And Fan-Out Wafer Level Packaging Applications
    7/8/2015

    Rudolph Technologies, Inc. announced recently that a leading Taiwan-based outsourced assembly and test (OSAT) manufacturer has selected the JetStep W2300 Advanced Packaging Lithography System for the development of next-generation advanced packaging technology

  6. Light-Based Technologies At Work: ‘Seeing’ Through Walls, Monitoring Cancer Treatments And Air Pollution, Preserving Artworks -- And Much More
    7/7/2015

    Co-located major European conferences in optical metrology and biomedical optics held in Munich, Germany, 21-25 June, featured highlights including two Nobel Laureates who presented during an International Year of Light (IYL2015) session on their pioneering work to enhance the resolution of microscopes

  7. Keysight Technologies Introduces Industry's First Modular Stimulus Response Measurement Solution
    7/1/2015

    Keysight Technologies, Inc. recently announced the release of four new M9290A CXA-m PXIe signal analyzer tracking generator options.

  8. Coordinate Metrology Society Hosts Hollywood Metrology Days During The 2015 Coordinate Metrology Systems Conference In Hollywood, FL
    6/30/2015

    The Coordinate Metrology Society (CMS), the eminent membership association for measurement professionals, today announced they will host Hollywood Metrology Days during the 31st annual Coordinate Metrology Systems Conference (CMSC), July 20 – 24, at The Diplomat Hotel in Hollywood, FL

  9. New 3D Metrology Software From FARO Delivers Increased Productivity With Simultaneous Measurement Capabilities
    6/30/2015

    FARO Technologies, Inc. (NASDAQ: FARO), the world's most trusted source for 3D measurement, imaging and realization technology, announces the release of CAM2 Measure 10.5, its latest software for the FaroArm, FARO® ScanArm, FARO® Laser Tracker, and FARO® 3D Imager

  10. Leading Taiwan OSAT Adopts Zeta Instruments Metrology System For Advanced Semiconductor Manufacturing
    6/29/2015

    Zeta Instruments, Inc., announced recently that a leading Taiwan based outsourced semiconductor assembly and test (OSAT) ordered its third Zeta-580 automated metrology system for production monitoring of advanced semiconductor packaging, including 2.5D interconnect and fan-out wafer level packaging (FOWLP)

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