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Heliotis M3 And M3-XL 3D Optical Profilers Integrate MountainsMap Imaging Topography Software
2/3/2012
Heliotis and Digital Surf announced that MountainsMap Imaging Topography surface metrology software based upon Digital Surf's Mountains Technology will be supplied with Heliotis M3 and M3-XL 3D Optical Profilers
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Konica Minolta Sensing Launches New CL-500A Illuminance Spectrophotometer
2/3/2012
Konica Minolta Sensing Americas, Inc. (KMSA), the worldwide leader in the industrial measurement of color, light and 3D shape, announces the launch of its newest light measurement product, the CL-500A Illuminance Spectrophotometer
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Capture 3D's New ATOS Compact Scan - New Breed Of 3D Scanner For Fast And Accurate 3D Measurements
2/3/2012
Capture 3D's GOM ATOS series of industrial optical 3D scanners provide accurate scans with detailed resolution at high speeds. ATOS delivers 3D measurement data and analysis for industrial components such as sheet metal parts, tools and dies, turbine blades, prototypes, injection molded parts, castings, and more
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IET Labs Purchases The 1900 Series And 7600 Plus Precision LCR Meter Lines From QuadTech Inc.
2/3/2012
IET Labs, is a leading provider of Decade Resistor, Inductance and Capacitor Standards, Megohmmeters, Stroboscopes and Digibridge LCR Meters, announces that it has purchased the 1910, 1920 and 7600 Plus Precision LCR Meter Products from QuadTech Inc
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Knight Optical Invests In Trioptics Optispheric Instrument
2/3/2012
Knight Optical (UK) Ltd. continues its investment in its Metrology laboratory with the installation of a Trioptics Optispheric with a Wavesensor Reflex attachment
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Nova’s Metrology Solutions Are Selected By A Leading Logic Manufacturer For Development Of Advanced Technology Nodes
2/3/2012
Nova Measuring Instruments Ltd. provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, recently announced that a leading logic manufacturer recently selected Nova for its most advanced standalone metrology tool and software modeling platform
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New QUADRA-CHEK Metrology Software Provides Increased Functionality For Measuring Machines
2/3/2012
HEIDENHAIN announces the latest version of their PC-based QUADRA-CHEK Metrology software providing advanced functionality for inspection measurement machines
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Mitutoyo Introduces World’s First 0.1µm Micrometer
2/3/2012
Mitutoyo America Corporation announces availability of its new, High-Accuracy Digimatic Digital Micrometer – the first micrometer to offer 0.1µm resolution measurement. Now, high-accuracy measurement can be had in a convenient, hand-held tool
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New MK52 Negative-Stiffness Optical Vibration Isolation Table
1/24/2012
Minus K Technology, a leading manufacturer of vibration isolation products has partnered with Kinetic Systems, Inc. in designing a new, versatile, ultra-low natural frequency optical table isolation system.
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NIST Releases Two New SRMs For Monitoring Human Exposure To Environmental Toxins
1/11/2012
The National Institute of Standards and Technology (NIST), in collaboration with the Centers for Disease Control and Prevention (CDC), has developed two new Standard Reference Materials (SRMs) for measurements of human exposure to environmental toxins