Business Wire

  1. Nanometrics Announces Advanced Metrology Milestone
    1/9/2012
    Nanometrics Incorporated, a leading supplier of advanced process control systems and solutions, Recently announced a significant milestone marking the adoption of its optical critical dimension (OCD) technology
  2. The L.S. Starrett Company Acquires Bytewise, A Non-Contact, Profile Measurement Systems Manufacturer To Extend Its Reach In The Test And Measurement Market
    11/23/2011
    The L.S. Starrett Company announced recently the acquisition of Bytewise Development Corp. located in Columbus, Georgia USA, a leading manufacturer of metrology products
  3. Nanometrics Acquires Nanda Technologies
    11/21/2011
    Nanometrics Incorporated, a leading supplier of solutions for advanced process control, recently announced the acquisition of Nanda Technologies, GmbH ("Nanda") of Munich, Germany
  4. Rudolph Receives First Orders For 450 mm Defect Inspection And Thin Film Metrology Systems
    10/12/2011
    Rudolph Technologies, Inc., a leading provider of process characterization equipment and software for the semiconductor, solar and LED industries, announced recently it has received the first orders for its leading-edge defect inspection and latest generation thin film metrology tools capable of supporting integrated circuit manufacturing on 450 mm silicon wafers
  5. Rudolph Fulfills Multiple System Orders For TSV Inspection And Metrology
    10/3/2011
    Rudolph Technologies, Inc., a leading provider of process characterization equipment and software for the semiconductor, solar and LED industries, announced today that it has shipped its Wafer Scanner 3880 3D Inspection System, multiple NSX Macro Defect Inspection Systems and its Discover Yield Management Software Suite to a leading semiconductor manufacturer for use in developing through silicon via (TSV) based processes for advanced 3D IC integration
  6. Bruker Announces Agreement To Acquire CETR
    9/12/2011
    Bruker Corporation recently announced the signing of a purchase agreement to acquire Center for Tribology, Inc. (CETR) for an undisclosed amount. CETR, a privately held corporation located in Silicon Valley in Campbell, CA, is projected to have calendar year 2011 revenue greater than $10M and EBITDA greater than $2M
  7. Transcat Acquires Newark’s Calibration Services Business
    9/8/2011
    Transcat, Inc. ("Transcat" or the "Company"), a leading distributor of professional grade handheld test and measurement instruments and accredited provider of calibration, repair and other measurement services, announced recently that it has acquired the calibration services business from Newark, a subsidiary of Premier Farnell, PLC (LSE: PFL.L)
  8. Bruker Introduces Dimension Edge PSS Atomic Force Microscope For Advanced HB-LED Production Metrology
    8/15/2011
    Bruker recently launched the Dimension Edge PSS Atomic Force Microscope (AFM), a production-environment AFM specifically tailored for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing
  9. MTI Instruments Introduces New Line Of 2D Laser Products
    8/3/2011
    MTI Instruments, Inc. (MTII) of Albany, NY, a worldwide leader in precision measurement solutions, and a subsidiary of Mechanical Technology Incorporated (MTI), announced today the launch of its new Microtrak PRO-2D laser triangulation scanners which provide high speed profile, displacement and dimensional information in real time
  10. Industry-Leading Semiconductor Companies Join SEMATECH’s EUVL Mask Infrastructure (EMI) Partnership At UAlbany NanoCollege
    7/12/2011
    SEMATECH announced today that Intel, GLOBALFOUNDRIES, Samsung Electronics Co., Ltd., and TSMC have joined SEMATECH's EMI Partnership to develop critical metrology tools for reviewing defects in advanced masks needed for extreme ultraviolet lithography (EUVL)

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