Downloads


Brochure: Infra Red Confocal Microscope - LEXT IR

Olympus Industrial America

File Size: 4.48 MB   Estimated Download Time: < 1 min
Description

The LEXT OLS-3000IR is our new near-IR laser based confocal microscope for nondestructive interior observation of silicon wafers, IC chips, MEMS and other devices.

Need Information?

Search:

Tips

Please wait... busy

Send This Page To An Associate: