News | September 13, 2005

Zygo Announces Opening Of Semiconductor Process Metrology Group In Oregon

Middlefield, CT -- Zygo Corporation announced the official opening of a new facility in Beaverton, Oregon. The facility will house the Company's recently formed semiconductor process metrology group under Dr. Michael J. Darwin.

Prior to joining ZYGO, Dr. Darwin held the positions of Process Metrology Group Leader at Intel's Portland Technology Development center in Hillsboro, Oregon, and Director of Technology Development at Rudolph Technologies in Flanders, New Jersey. During his tenure at Intel, Dr. Darwin participated in the creation of Intel's 5-generation roadmap for thin film metrology, and managed numerous 300mm metrology tool selections for Intel's development and high volume manufacturing lines. He and his team will lead ZYGO's semiconductor process control product development activities, and provide worldwide applications support.

Bruce Robinson, ZYGO's Chairman and Chief Executive Officer, stated "We recently launched a major strategic initiative to bring our world class optical metrology and detection technology to the semiconductor process control industry. Our new Oregon office, under Dr. Darwin's leadership, is a key part of that strategy, and it is a measure of our long-term commitment to the industry and our key customers."

SOURCE: Zygo Corporation