TECAT Performance Systems today announced that it is now shipping its new WISER 4000 wireless torque measuring and monitoring system for automotive, industrial, energy, and aviation applications
4D Technology today announced the 4D InSpec™ Surface Gauge, the first handheld, non-contact instrument that measures precision machined surface defects and features with micrometer-level resolution
Bruker today unveils two new preclinical imaging systems at the World Molecular Imaging Congress 2016 (WMIC: http://www.wmis.org) in New York
Rudolph Technologies, Inc. recently launched two new inspection and metrology solutions for advanced semiconductor manufacturing: the Firefly system for high-resolution inspection in front- and back-end applications, and the Dragonfly system for high-speed two-dimensional (2D) inspection in advanced packaging processes
NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, recently announced new RF capabilities for higher power transmit and receive, and FPGA-based real-time envelope tracking and digital predistortion for the Semiconductor Test System (STS).
Kochava (www.kochava.com), the mobile attribution, analytics and optimization company, recently announced the addition of dynamic media cost data to the Kochava dashboard, making Kochava the only provider to include holistic, dynamic media cost data, solidifying the view of an ad campaign with clear cost and performance that is completely customizable