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Leuven - Nikon Metrology announces the compact yet versatile XT V 130 X-ray inspection system that efficiently traces failures inside complex electronic devices and multilayer circuit boards. To maintain highest quality standards in an environment of continuous miniaturization, electronics manufacturers prefer deploying intuitive, reliable and efficient X-ray imaging capability in-house. The XT V 130 is a compact and affordable X-ray system for automated QA on serial-produced electronic samples. The XT V 130 inspection system will be demonstrated in premiere at the Productronica show in Munich, Germany (November 10-13).

QA workhorse for electronics X-ray
Hidden electronic defects arisen during production or assembly generally result in system failure, fabrication delay and additional cost. These defects can be detected efficiently early on in the process by taking an in-depth look at the inside of electronic specimens. Designed for high-throughput electronics X-ray inspection, the XT V 130 is a real QA workhorse that allows operators to provide instant pass/fail status. Automated inspection functions and (optional) automatic board identification ensure high inspection throughput rates. Inspection reports compliant with MRP systems facilitate tight integration into customers' manufacturing processes. Today, any OEM and subsystem supplier of consumer, automotive, aerospace, medical and electronics can take advantage of X-ray inspection technology to get the job done!

Qualitative and robust X-ray imaging
The system comes with a 30-130kV open micro-focus X-ray source, a 4-axis programmable manipulator and a 16-bit imaging system based on a 4" image intensifier. A focal spot size down to 3 micron, 320x geometric magnification and tilt angle up to 60° offer excellent image quality and sufficient flexibility. A rotate stage and CT capability are available as option. A hinged door provides easy access to the inspection area, which fits samples up to 40x35cm (16x14").

Using qualitative real-time X-ray capabilities, operators intuitively navigate through the layers of a PCB or inside electronic devices, by changing position, angle and zoom as desired using the joystick. The XT V 130 system is ideally suited to quickly trace material inconsistencies, connectivity issues, incomplete through-layer vias and other failures.

Intuitive and interactive image processing
The intuitive operation of the compact XT V 130 system is controlled by Inspect-X, the powerful proprietary software used on all Nikon Metrology XT systems. Inspect-X is known for its powerful X-ray image processing and analysis as well as the broad set of automation capabilities that is included. Developed to streamline the inspection process with ultrafast Xray acquisition, the XT V 130 runs first-article inspection in minutes, instead of hours or days.

Providing real value for money
Besides easy operation, the Nikon Metrology XT V 130 system offers low cost of ownership. The open X-ray tube installed in the system allows for quick replacement of low-cost filaments. All serviceable components are installed on a drawer that can be opened from the front, making the system very easy to service. Thanks to its footprint that is limited to just 1m2, a built-in generator and weight below 1150kg, the XT V 130 system easily fits any electronics production area without requiring high-voltage power or special floor conditions. The system's protective enclosure puts safety first, avoiding the use of dedicated badges or protective clothing.

A complete range of electronic X-ray systems
In Nikon Metrology's range of electronic X-ray systems, which originates from the renowned X-ray system manufacturer X-Tek, the XT V 130 is a QA workhorse machine with an optimum performance-price ratio. It ideally complements the top-line XT V 160 system, previously named X-Tek Revolution, a powerful R&D and production engineering system featuring a superb nanotech 160kV X-ray source. The possibility to configure a flat panel imager enables the system to acquire images with highest resolution. In addition, the XT V 160 offers CT capability, a market-leading 75° tilt angle and a standard rotate stage with true concentric imaging to readily reveal and resolve weak points in the PCB manufacturing process. Recently, the design of the top-line XT V 160 system has been further enhanced based on customer feedback. To obtain faster access to the inspection area and better viewing of the sample, the sliding window is replaced by a standard door and window combination. This modification also allows larger samples to be inserted into the system and provides easier access to the gun for filament changes. To simplify system operation, all controls have been centralized into a single easy-to-use panel. Furthermore, the sample manipulator has been strengthened further to make concentric movement of the sample even more accurate and stable. Overall, Nikon Metrology has a worldwide install base of approximately 1,500 X-ray and CT systems.

SOURCE: NIKON METROLOGY