LATEST HEADLINES
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Sony Semiconductor Solutions To Release X-Ray CMOS Sensor With Industry's Fastest(*1) Imaging And Low-Noise Performance For Inspection And Measurement Instrumentation6/8/2026
Sony Semiconductor Solutions Corporation (Sony) today announced the upcoming release, mass-production, and shipment of the IMX711 direct conversion charge-integrating X-ray CMOS image sensor.
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Hexagon Manufacturing Intelligence Launches PC-DMIS FUSION, Modernizing Metrology Reporting And Analytics6/6/2026
Hexagon Manufacturing Intelligence’s Stationary Metrology Division today announced the launch of PC-DMIS FUSION. It provides PC-DMIS users with real-time information, visualisation, insights, and SPC analysis to enable increased productivity based on data-driven decision making.
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Second Global ISO Standard Expands LumaCyte Measurement Framework To Mammalian Cell Viability6/2/2026
A newly released International Organization for Standardization (ISO) global standard for mammalian cell viability brings greater consistency to how cellular state is assessed across biologics and cell therapy.
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SICK Integrates Aeva's High-Precision Technology Into Industrial Sensing Product Line6/2/2026
Aeva, a leader in next-generation sensing and perception systems, today announced that SICK, a leading provider of sensor-based automation solutions, is expanding its industrial sensing product portfolio with new Frequency Modulated Continuous Wave (FMCW)-based technology powered by Aeva.
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Invisix Raises €20M Seed Round To Bring Soft X-Ray Metrology To AI-Era Chip Manufacturing6/1/2026
Invisix, the semiconductor metrology company developing next-generation measurement tools for advanced chip manufacturing, has raised an oversubscribed €20 million seed round, which includes Hitachi Ventures, Transition Ventures, imec.xpand, Doosan Investment Co., and a tier-1 semiconductor manufacturer.
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Park Systems Launches Park FX40 IR, Uniting Full AFM Performance And Nanoscale IR Spectroscopy In A Single Automated Platform5/29/2026
Park Systems Corp., the world's leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, today announced the commercial launch of the Park FX40 IR, completing the company's Nano-IR spectrometer portfolio with a small-sample platform.